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ATIS T1.105.03 : 2003
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SYNCHRONOUS OPTICAL NETWORK (SONET) - JITTER AND WANDER AT NETWORK AND EQUIPMENT INTERFACES |
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IEC 60068-1:2013
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Environmental testing - Part 1: General and guidance |
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IEC 60068-2-58:2015+AMD1:2017 CSV
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Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD) |
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IEC 60068-2-27:2008
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Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
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IEC 60068-2-20:2008
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Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
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IEC 60679-4:1997
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Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval |
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IEC 60679-3A:1991
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First supplement |
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IEC 60068-2-21:2006
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Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
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IEC 60068-2-13:1983
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Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure |
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IEC 60679-5:1998
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Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval |
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IEC 60027-1:1992
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Letters symbols to be used in electrical technology - Part 1: General |
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IEC 60469-1:1987
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Pulse techniques and apparatus. Part 1: Pulse terms and definitions |
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GR 253 CORE : ISSUE 5
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SYNCHRONOUS OPTICAL NETWORK (SONET) TRANSPORT SYSTEMS: COMMON GENERIC CRITERIA |
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IEC 60410:1973
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Sampling plans and procedures for inspection by attributes |
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IEC 60068-2-3:1969
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Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
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IEC GUIDE 102:1996
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Electronic components - Specification structures for qualityassessment (Qualification approval and capability approval) |
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IEC 60068-2-17:1994
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Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
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IEC 60068-2-10:2005
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Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth |
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IEC 60068-2-2:2007
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Environmental testing - Part 2-2: Tests - Test B: Dry heat |
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IEC 61000-4-3:2006+AMD1:2007+AMD2:2010 CSV
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Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test |
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IEEE 1139-2008
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IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology--Random Instabilities |
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IEC 60050-561:2014
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International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection |
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IEC 60027-2:2005
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Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics |
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IEC 60068-2-29:1987
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Environmental testing. Part 2: Tests. Test Eb and guidance: Bump |
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ATIS T1.101 : 1999
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SYNCHRONIZATION INTERFACE STANDARD |
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IEC 60068-2-1:2007
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Environmental testing - Part 2-1: Tests - Test A: Cold |
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IEC 60679-3:2012
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Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections |
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IEC 61178-1:1993
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Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification |
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IEC 60679-2:1981
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Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators |
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IEC 60068-2-14:2009
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Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
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IEC 60068-2-52:2017
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Environmental testing - Part 2-52: Tests - Test Kb: Salt mist, cyclic (sodium chloride solution) |
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IEC 60801-2:1991
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Electromagnetic compatibility for industrial-process measurement and control equipment - Part 2: Electrostatic discharge requirements |
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IEC 60068-2-30:2005
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Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |