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  • 11/30243576 DC : DRAFT FEB 2011

    Current The latest, up-to-date edition.

    BS EN 62643-1 - ELECTROSTATIC MICRO ELECTRO MECHANICAL SYSTEMS (MEMS) OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION

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    Published date:  23-11-2012

    Publisher:  British Standards Institution

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    Comment Closes On
    Committee EPL/49
    Document Type Draft
    Publisher British Standards Institution
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    ATIS T1.105.03 : 2003 SYNCHRONOUS OPTICAL NETWORK (SONET) - JITTER AND WANDER AT NETWORK AND EQUIPMENT INTERFACES
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    IEC 60068-2-58:2015+AMD1:2017 CSV Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD)
    IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
    IECQ 001002-3:2005 IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES
    IEC 60679-4:1997 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval
    IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
    IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
    IECQ 001002-2:1998 IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 2: DOCUMENTATION
    IEC 60679-5:1998 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
    IEC 60068-2-31:2008 Environmental testing - Part 2-31: Tests - Test Ec: Rough handling shocks, primarily for equipment-type specimens
    IEC 60068-2-64:2008 Environmental testing - Part 2-64: Tests - Test Fh: Vibration, broadband random and guidance
    IEC 60469-1:1987 Pulse techniques and apparatus. Part 1: Pulse terms and definitions
    IEC Q 01 : 5.0 IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ SYSTEM) - BASIC RULES
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    IEC GUIDE 102:1996 Electronic components - Specification structures for qualityassessment (Qualification approval and capability approval)
    IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
    IEC 60068-2-10:2005 Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth
    IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
    IEC 61000-4-2:2008 Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test
    IEC 61000-4-3:2006+AMD1:2007+AMD2:2010 CSV Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test
    IECQ 001002-5:2008 IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ SCHEME) RULES OF PROCEDURE - PART 5: HAZARDOUS SUBSTANCE PROCESS MANAGEMENT REQUIREMENTS (IECQ HSPM)
    IEEE 1139-2008 IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology--Random Instabilities
    IECQ 001002-1:1998 IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 1: ADMINISTRATION
    TIA/EIA 644 : A2001(R2012) ELECTRICAL CHARACTERISTICS OF LOW VOLTAGE DIFFERENTIAL SIGNALING (LVDS) INTERFACE CIRCUITS
    IEC 60050-561:2014 International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
    IEC 60122-1:2002 Quartz crystal units of assessed quality - Part 1: Generic specification
    ATIS T1.101 : 1999 SYNCHRONIZATION INTERFACE STANDARD
    IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    IEC 60679-3:2012 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
    IEC 60679-2:1981 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
    IEC 60068-2-44:1995 Environmental testing - Part 2-44: Tests - Guidance on test T: Soldering
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
    IEC 60068-2-52:2017 Environmental testing - Part 2-52: Tests - Test Kb: Salt mist, cyclic (sodium chloride solution)
    IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
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