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  • 17/30319520 DC : 0

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    BS ISO 20289 - SURFACE CHEMICAL ANALYSIS - TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS OF WATER SAMPLES

    Available format(s):  Hardcopy, PDF

    Superseded date:  31-03-2018

    Language(s):  English

    Published date: 

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Foreword
    Introduction
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Symbols and abbreviations
    5 Safety
    6 Interferences
    7 Apparatus
    8 Reagents, standards and materials
    9 Sample preparation
    10 Procedure
    11 Qualitative and quantitative analysis
    12 Quality control
    13 Precision and Accuracy
    14 Test report
    Annex A (informative) - Uncertainty in
            TXRF measurements
    Annex B (informative) - Validation of the method
    Annex C (informative) - Results of international
            inter-laboratory test program
    Bibliography

    General Product Information - (Show below) - (Hide below)

    Comment Closes On
    Committee CII/60
    Document Type Draft
    Publisher British Standards Institution
    Status Superseded

    Standards Referencing This Book - (Show below) - (Hide below)

    ISO 5725-1:1994 Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions
    ISO 17331:2004 Surface chemical analysis Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
    ISO 5725-4:1994 Accuracy (trueness and precision) of measurement methods and results Part 4: Basic methods for the determination of the trueness of a standard measurement method
    ISO 5667-2:1991 Water quality Sampling Part 2: Guidance on sampling techniques
    ISO 14706:2014 Surface chemical analysis Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
    ISO 5667-3:2012 Water quality Sampling Part 3: Preservation and handling of water samples
    ISO 5667-1:2006 Water quality Sampling Part 1: Guidance on the design of sampling programmes and sampling techniques
    ISO 18115:2001 Surface chemical analysis Vocabulary
    ISO 7888:1985 Water quality — Determination of electrical conductivity
    ISO 14644-1:2015 Cleanrooms and associated controlled environments Part 1: Classification of air cleanliness by particle concentration
    ISO 5725-2:1994 Accuracy (trueness and precision) of measurement methods and results Part 2: Basic method for the determination of repeatability and reproducibility of a standard measurement method
    ISO 3696:1987 Water for analytical laboratory use — Specification and test methods
    ISO 8466-1:1990 Water quality Calibration and evaluation of analytical methods and estimation of performance characteristics Part 1: Statistical evaluation of the linear calibration function
    ISO/TS 18507:2015 Surface chemical analysis — Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
    ISO 5725-5:1998 Accuracy (trueness and precision) of measurement methods and results — Part 5: Alternative methods for the determination of the precision of a standard measurement method
    ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)
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