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  • BS EN 60747-5-2:2001

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    Discrete semiconductor devices and integrated circuits. Optoelectronic devices Essential ratings and characteristics

    Available format(s):  Hardcopy, PDF

    Superseded date:  30-06-2015

    Language(s):  English

    Published date:  17-01-2003

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 Light-emitting diodes (excluding devices for fibre
       optic systems or subsystems)
       3.1 Type
       3.2 Semiconductor material
       3.3 Colour
       3.4 Details of outline and encapsulation
       3.5 Limiting values (absolute maximum system)
       3.6 Electrical characteristics
       3.7 Supplementary information
    4 Infrared-emitting diodes (excluding devices for fibre
       optic systems or subsystems)
       4.1 Type
       4.2 Semiconductor material
       4.3 Details of outline and encapsulation
       4.4 Limiting values (absolute maximum system)
       4.5 Electrical characteristics
       4.6 Supplementary information
    5 Photodiodes (excluding devices for fibre optic systems or
       subsystems)
       5.1 Type
       5.2 Semiconductor material
       5.3 Details of outline and encapsulation
       5.4 Limiting values (absolute maximum system)
       5.5 Electrical characteristics
       5.6 Supplementary information
    6 Phototransistors (excluding devices for fibre optic
       systems or subsystems)
       6.1 Type
       6.2 Semiconductor material
       6.3 Polarity
       6.4 Details of outline and encapsulation
       6.5 Limiting values (absolute maximum system)
       6.6 Electrical characteristics
       6.7 Supplementary information
    7 Photocouplers, optocouplers (with output transistor)
       7.1 Type
       7.2 Semiconductor material
       7.3 Polarity of the output resistor
       7.4 Details of outline and encapsulation
       7.5 Limiting values (absolute maximum system)
       7.6 Electrical characteristics
       7.7 Supplementary information
    8 Photocouplers (optocouplers) providing protection
       against electrical shock
       8.1 Type
       8.2 Semiconductor material
       8.3 Details of outline and encapsulation
       8.4 Ratings
       8.5 Electrical characteristics
       8.6 Electrical, environmental and/or endurance
            information (supplementary information)
    9 Laser diodes
       9.1 Type
       9.2 Semiconductor
       9.3 Details of outline and encapsulation
       9.4 Limiting values (absolute maximum system)
       9.5 Electrical and optical characteristics
       9.6 Supplementary information
    Annexes
    A (informative) Cross references index
    B (normative) Input/output safety test
    Figures
    Tables

    Abstract - (Show below) - (Hide below)

    Provides essential ratings and characteristics of several categories or subcategories of optoelectronic devices not intended for use in the area of fibre optic systems or subsystems.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47
    Development Note To be read in conjunction with IEC 60747-1, IEC 62007-1 and IEC 62007-2 Renumbers and supersedes BS IEC 60747-5.2 2001 Version incorporates amendment 13433 to BS IEC 60747-5.2 (01/2002) Supersedes 00/202968 DC (02/2003)
    Document Type Standard
    Publisher British Standards Institution
    Status Superseded
    Superseded By
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60112:2003+AMD1:2009 CSV Method for the determination of the proof and the comparative tracking indices of solid insulating materials
    IEC 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
    HD 214 : 200S2 RECOMMENDED METHOD FOR DETERMINING THE COMPARATIVE TRACKING INDEX OF SOLID INSULATING MATERIALS UNDER MOIST CONDITIONS
    IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    EN 60065:2014/AC:2017-01 AUDIO, VIDEO AND SIMILAR ELECTRONIC APPARATUS - SAFETY REQUIREMENTS (IEC 60065:2014/COR2:2016)
    EN 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    HD 625.1 : 200S1 INSULATION COORDINATION FOR EQUIPMENT WITHIN LOW-VOLTAGE SYSTEMS - PRINCIPLES, REQUIREMENTS AND TESTS
    EN 60747-5-3:2001/A1:2002 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-3: OPTOELECTRONIC DEVICES - MEASURING METHODS
    IEC 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
    IEC 60216-2:2005 Electrical insulating materials - Thermal endurance properties - Part 2: Determination of thermal endurance properties of electrical insulating materials - Choice of test criteria
    EN 60747-5-1:2001/A2:2002 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-1: OPTOELECTRONIC DEVICES - GENERAL
    HD 611.1 : 200S1 GUIDE FOR THE DETERMINATION OF THERMAL ENDURANCE PROPERTIES OF ELECTRICAL INSULATING MATERIALS - GENERAL GUIDELINES FOR AGEING PROCEDURES AND EVALUATION OF TEST RESULTS
    IEC 60747-5-3:1997+AMD1:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
    IEC 60306-1:1969 Measurement of photosensitive devices - Part 1: Basic recommendations
    EN 60068-2-27:2009 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    HD 323.2.3 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE
    IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
    EN 60068-2-17:1994 Environmental testing - Part 2: Tests - Test Q: Sealing
    IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
    IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60672-2:1999 Ceramic and glass insulating materials - Part 2: Methods of test
    EN 60068-2-6:2008 Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal)
    IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
    IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    EN 60651:1994/A2:2001 SOUND LEVEL METERS (IEC 60651:1979/A2:2000)
    EN 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
    HD 323.2.2 : 200S1 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST B: DRY HEAT
    HD 426.2 : 200S1 SPECIFICATION FOR CERAMIC AND GLASS INSULATING MATERIALS - METHODS OF TEST
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    HD 611.2 : 200S1 GUIDE FOR THE DETERMINATION OF THERMAL ENDURANCE PROPERTIES OF ELECTRICAL INSULATING MATERIALS - CHOICE OF TEST CRITERIA
    IEC 60664-1:2007 Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests
    EN 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    IEC 60216-1:2013 Electrical insulating materials - Thermal endurance properties - Part 1: Ageing procedures and evaluation of test results
    EN 60695-2-2:1994/A1:1995 FIRE HAZARD TESTING - TEST METHODS - NEEDLE-FLAME TEST
    IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
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