BS EN 61193-2:2007

INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Sampling system
  4.1 Formation and identification of lots
  4.2 Drawing of samples
      4.2.1 Selection of sample items
      4.2.2 Process of sampling
  4.3 Sampling plans
      4.3.1 Inspection level
      4.3.2 Sampling plan for normal inspection
      4.3.3 Acceptance number
      4.3.4 Tightened or reduced inspection
5 Acceptance and rejection
  5.1 Acceptability criteria
  5.2 Disposition of rejected lots
6 Statistical verified quality limit (SVQL)
  6.1 General
  6.2 Calculation of the SVQL
Annex A (informative) - Estimation of the statistical verified
                        quality limit (SVQL) in nonconforming
                        items per million (x10[-6]) at a
                        confidence limit 60%
Annex B (informative) - Relationship between this standard
                        and ISO 2859-1
Annex C (informative) - Example of application of this standard
                        (lot-by-lot inspection of assessment
                        level EZ in IEC/TC 40)
Annex ZA (normative) - Normative references to international
                       publications with their corresponding
                       European publications
Bibliography

Specifies the inspection of electronic components, packages, and also modules (referred to as "products" in this standard) for use in electronic and electric equipment.

Applies to the inspection of electronic components, packages, and also modules (referred to as \'products in this standard) for use in electronic and electric equipment. It specifies sampling plans for inspection by attributes on the assumption that the acceptance number is zero (Ac = 0), including criteria for sample selection and procedures.