• BS EN 61967-4 : 2002

    Current The latest, up-to-date edition.

    INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-2002

    Publisher:  British Standards Institution

    Add To Cart

    Table of Contents - (Show below) - (Hide below)

    1 Scope
    2 Normative references
    3 Definitions
    4 General
      4.1 Measurement basics
      4.2 RF current measurement
      4.3 RF voltage measurement at IC pins
      4.4 Assessment of the measurement technique
    5 Test conditions
    6 Test equipment
      6.1 Test receiver specification
      6.2 RF current probe specification
      6.3 Test of the RF current probe capability
      6.4 Matching network specification
    7 Test set-up
      7.1 General test configuration
      7.2 Printed circuit test board layout
    8 Test procedure
    9 Test report
    Annex A (normative) Probe calibration procedure
    Annex B (informative) Classification of conducted emission
            levels
      B.1 Introductory remark
      B.2 General
      B.3 Definition of emission levels
      B.4 Presentation of results
    Annex C (informative) Example of reference levels for
            automotive applications
      C.1 Introductory remark
      C.2 General
      C.3 Reference level
    Annex D (informative) EMC requirements and how to use
            EMC IC measurement techniques
      D.1 Introduction
      D.2 Using EMC measurement procedures
      D.3 Assessment of the IC influence to the EMC behaviour
          of the modules
    Annex E (informative) Example of a test set-up consisting
            of an EMC main test board and an EMC IC test board
      E.1 The EMC main test board
      E.2 EMC IC test board
    Annex F (informative) 150 ohms direct coupling networks for
            common mode emission measurements of differential
            mode data transfer ICs and similar circuits
    Annex ZA (normative) Normative references to international
             publications with their corresponding European
             publications

    Abstract - (Show below) - (Hide below)

    Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47
    Development Note Supersedes 98/232942 DC (09/2002)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
    CISPR 16-1-4:2010+AMD1:2012+AMD2:2017 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-4: Radio disturbance and immunity measuring apparatus - Antennas and test sites for radiated disturbance measurements
    CISPR 16-1-1:2015 Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-1: Radio disturbance and immunity measuring apparatus - Measuring apparatus
    CISPR 16-1-3:2004+AMD1:2016 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-3: Radio disturbance and immunity measuring apparatus - Ancillary equipment - Disturbance power
    CISPR 16-1-5:2014+AMD1:2016 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-5: Radio disturbance and immunity measuring apparatus - Antenna calibration sites and reference test sites for 5 MHz to 18 GHz
    EN 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
    IEC 61000-4-6 : 4.0 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-6: TESTING AND MEASUREMENT TECHNIQUES - IMMUNITY TO CONDUCTED DISTURBANCES, INDUCED BY RADIO-FREQUENCY FIELDS
    IEC 61000-4-6:2013 Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
    EN 61000-4-6:2014/AC:2015 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-6: TESTING AND MEASUREMENT TECHNIQUES - IMMUNITY TO CONDUCTED DISTURBANCES, INDUCED BY RADIO-FREQUENCY FIELDS (IEC 61000-4-6:2013)
    CISPR 16-1:1999+AMD1:2002 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1: Radio disturbance and immunity measuring apparatus
    • Access your standards online with a subscription

      Features

      • Simple online access to standards, technical information and regulations
      • Critical updates of standards and customisable alerts and notifications
      • Multi - user online standards collection: secure, flexibile and cost effective