IEC 60950-1:2005+AMD1:2009+AMD2:2013 CSV
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Information technology equipment - Safety - Part 1: General requirements |
EN 62007-2:2009
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Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods |
IEC GUIDE 107:2014
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Electromagnetic compatibility - Guide to the drafting of electromagnetic compatibility publications |
EN 60825-1:2014/AC:2017-06
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SAFETY OF LASER PRODUCTS - PART 1: EQUIPMENT CLASSIFICATION AND REQUIREMENTS (IEC 60825-1:2014) |
IEC 62007-1:2015
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Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics |
IEC 60068-2-27:2008
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Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
IEC 60749-25:2003
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Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling |
IEC 60068-2-20:2008
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Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
EN 60068-2-20:2008
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Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
IEC 61290-1-3:2015
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Optical amplifiers - Test methods - Part 1-3: Power and gain parameters - Optical power meter method |
EN 61300-2-47:2016
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Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-47: Tests - Thermal shocks |
EN 60950-1:2006/A2:2013
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INFORMATION TECHNOLOGY EQUIPMENT - SAFETY - PART 1: GENERAL REQUIREMENTS (IEC 60950-1:2005/A2:2013, MODIFIED) |
IEC 60825-1:2014
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Safety of laser products - Part 1: Equipment classification and requirements |
IEC 62007-2:2009
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Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods |
EN 60747-5-1:2001/A2:2002
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DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-1: OPTOELECTRONIC DEVICES - GENERAL |
EN 61290-1-3:2015
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Optical amplifiers - Test methods - Part 1-3: Power and gain parameters - Optical power meter method |
IEC 62149-4:2010
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Fibre optic active components and devices - Performance standards - Part 4: 1 300 nm fibre optic transceivers for Gigabit Ethernet application |
IEC 60068-2-38:2009
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Environmental testing - Part 2-38: Tests - Test Z/AD: Composite temperature/humidity cyclic test |
EN 60068-2-27:2009
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Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
EN 60068-2-38:2009
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Environmental testing - Part 2-38: Tests - Test Z/AD: Composite temperature/humidity cyclic test |
IEC 60749-26:2013
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Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) |
EN 62007-1:2015
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Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics |
IEC 62148-1:2017
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Fibre optic active components and devices - Package and interface standards - Part 1: General and guidance |
EN 60068-2-78:2013
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Environmental testing - Part 2-78: Tests - Test Cab: Damp heat, steady state |
EN 62149-4:2010
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Fibre optic active components and devices - Performance standards - Part 4: 1 300 nm fibre optic transceivers for Gigabit Ethernet application |
EN 60068-2-6:2008
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Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal) |
EN 60749-26:2014
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Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) |
IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV
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Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General |
IEC 61300-2-47:2016
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Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-47: Tests - Thermal shocks |
EN 62149-1:2012
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Fibre optic active components and devices - Performance standards - Part 1: General and guidance |
EN 60749-25:2003
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Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling |
IEC 62149-1:2011
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Fibre optic active components and devices - Performance standards - Part 1: General and guidance |