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  • BS IEC 61671:2012

    Current The latest, up-to-date edition.

    IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  31-08-2012

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    1. Overview
    2. Normative references
    3. Definitions, acronyms, and abbreviations
    4. Automatic test system (ATS) architecture
    5. Automatic test markup language (ATML)
    6. The ATML framework
    7. ATML specification techniques
    8. The ATML framework subdomains
    9. ATML XML schema names and locations
    10. ATML XML schema extensibility
    11. Conformance
    Annex A (normative) - XML schema style guidelines
    Annex B (normative) - ATML common element schemas
    Annex C (normative) - ATML internal model schemas
    Annex D (normative) - ATML runtime services
    Annex E (informative) - Pins, ports, connectors, and wire
            lists in ATML
    Annex F (informative) - ATML capabilities
    Annex G (informative) - IEEE download Web site material
            associated with this document
    Annex H (informative) - ATS architectures
    Annex I (informative) - Architecture examples
    Annex J (informative) - UML models
    Annex K (informative) - Glossary
    Annex L (informative) - Bibliography
    Annex M (informative) - IEEE List of Participants

    Abstract - (Show below) - (Hide below)

    Describes a standard exchange medium for sharing information between components of ATSs.

    Scope - (Show below) - (Hide below)

    ATML defines a standard exchange medium for sharing information between components of ATSs. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using XML. This standard specifies the framework for the family of ATML standards.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/501
    Document Type Standard
    Publisher British Standards Institution
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    IEEE 1641.1-2013 IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition
    IEEE 1671.4-2014 IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration
    IEEE 1671.3-2007 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
    IEEE 1057-2007 REDLINE IEEE Standard for Digitizing Waveform Recorders
    IEEE 1155 : 1992 VMEBUS EXTENSIONS FOR INSTRUMENTATION: VXIBUS
    TIA 232 : F1997(R2012) INTERFACE BETWEEN DATA TERMINAL EQUIPMENT AND DATA CIRCUIT-TERMINATING EQUIPMENT EMPLOYING SERIAL BINARY DATA INTERCHANGE
    IEEE 1671.5-2015 REDLINE IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description
    IEC 60488-2:2004 Standard digital interface for programmable instrumentation - Part 2: Codes, formats, protocols and common commands
    IEEE 802.3-2012 IEEE Standard for Ethernet
    IEEE 1671.6-2015 REDLINE IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description
    IEEE 260.1 : 2004 LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS)
    IEEE 1445-1998 IEEE Standard for Digital Test Interchange Format (DTIF)
    EIA 682 : 1996 EDIF VERSION 400 ELECTRONIC DESIGN INTERCHANGE FORMAT
    IEEE 488.2 : 1992 STANDARD CODES, FORMATS, PROTOCOLS, AND COMMON COMMANDS FOR USE WITH IEEE 488.1-1987, IEEE STANDARD DIGITAL INTERFACE FOR PROGRAMMABLE INSTRUMENTATION
    IEEE 1505.1-2008 IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
    IEEE 1671.2-2012 IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
    ISO 8601:2004 Data elements and interchange formats Information interchange Representation of dates and times
    ISO 8879:1986 Information processing Text and office systems Standard Generalized Markup Language (SGML)
    IEEE 1636-2009 IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA)
    ISO/IEC 9899:2011 Information technology Programming languages C
    IEEE 1636.1-2013 IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)
    IEEE 754-2008 REDLINE IEEE Standard for Floating-Point Arithmetic
    IEEE 1671.1-2009 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions
    IEEE 1149.1-2013 REDLINE IEEE Standard for Test Access Port and Boundary-Scan Architecture
    IEEE/Open Group 1003.1, 2013 Edition IEEE Standard for Information Technology—Portable Operating System Interface (POSIX(TM)) Base Specifications, Issue 7
    MIL-STD-1309 Revision D:1992 DEFINITIONS OF TERMS FOR TEST, MEASUREMENT AND DIAGNOSTIC EQUIPMENT
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