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  • BS ISO 25498:2010

    Current The latest, up-to-date edition.

    Microbeam analysis. Analytical electron microscopy. Selected-area electron diffraction analysis using a transmission electron microscope

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  30-06-2010

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Introduction
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Principle
    5 Reference materials
    6 Equipment
    7 Specimens
    8 Experimental procedure
    9 Measurement and solution of the SAED patterns
    10 180 Degrees ambiguity
    11 Uncertainty estimation
    Annex A (informative) - Interplanar spacing
    Annex B (informative) - Spot diffraction patterns
            of single crystals for BCC, FCC and HCP
            structure
    Bibliography

    Abstract - (Show below) - (Hide below)

    Defines the method of selected area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse thin crystalline specimens. This document applies to test areas of micrometres and sub-micrometres in size.

    General Product Information - (Show below) - (Hide below)

    Committee CII/9
    Development Note Supersedes 17/30343628 DC. (03/2018)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Superseded By
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
    ISO 15932:2013 Microbeam analysis — Analytical electron microscopy — Vocabulary
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