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  • CEI EN 61000-4-29 : 2001

    Current The latest, up-to-date edition.

    ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-29: TESTING AND MEASUREMENT TECHNIQUES - VOLTAGE DIPS, SHORT INTERRUPTIONS AND VOLTAGE VARIATIONS ON D.C. INPUT POWER PORTS, IMMUNITY TESTS

    Available format(s):  Hardcopy, PDF

    Language(s):  English - Italian

    Published date:  01-01-2001

    Publisher:  Comitato Elettrotecnico Italiano

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    Table of Contents - (Show below) - (Hide below)

    INTRODUCTION
    1 SCOPE AND OBJECT
    2 NORMATIVE REFERENCES
    3 DEFINITIONS
    4 GENERAL
    5 TEST LEVELS
    6 TEST GENERATOR
    7 TEST SET-UP
    8 TEST PROCEDURE
    9 EVALUATION OF TEST RESULTS
    10 TEST REPORT
    ANNEX A (Informative) - EXAMPLE OF TEST GENERATORS
            AND TEST SET-UP
    ANNEX B (Informative) - INRUSH CURRENT MEASUREMENT
    ANNEX ZA (Normative) - Normative references to
             international publications with their
             corresponding European publications

    Abstract - (Show below) - (Hide below)

    Describes test methods for immunity to voltage dips, short interruptions and voltage variations at the d.c. input power port of electrical or electronic equipment.

    General Product Information - (Show below) - (Hide below)

    Committee CT 210
    Development Note Classificazione CEI 210-60 (09/2001)
    Document Type Standard
    Publisher Comitato Elettrotecnico Italiano
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    EN 61000-4-11:2004/A1:2017 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-11: TESTING AND MEASUREMENT TECHNIQUES - VOLTAGE DIPS, SHORT INTERRUPTIONS AND VOLTAGE VARIATIONS IMMUNITY TESTS (IEC 61000-4-11:2004/A1:2017)
    IEC 61000-4-11:2004+AMD1:2017 CSV Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests
    EN 61000-4-17:1999/A2:2009 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-17: TESTING AND MEASUREMENT TECHNIQUES - RIPPLE ON D.C. INPUT POWER PORT IMMUNITY TEST
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