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  • DD ISO/TS 10798 : DRAFT JULY 2011

    Current The latest, up-to-date edition.

    NANOTECHNOLOGIES - CHARACTERIZATION OF SINGLEWALL CARBON NANOTUBES USING SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE X-RAY SPECTROMETRY ANALYSIS

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    Published date:  23-11-2012

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Foreword
    Introduction
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 General principles
    5 Sample preparation methods
    6 Measurement procedures
    7 Data analysis and results interpretation
    8 Measurement uncertainty
    Annex A (normative) - SEM sampling methods
    Annex B (informative) - Supportive information on
            EDX characterization of CNT materials
    Annex C (informative) - Case study for the analysis
            of as-synthesized and purified SWCNT samples
    Annex D (informative) - Examples of SEM/EDX
            analysis of SWCNTs
    Bibliography

    Abstract - (Show below) - (Hide below)

    Describes methods to characterize the morphology, and to identify the elemental composition of, catalysts and other inorganic impurities in raw and purified single-wall carbon nanotube (SWCNT) powders and films, using scanning electron microscopy and energy dispersive X-ray spectrometry analysis.

    General Product Information - (Show below) - (Hide below)

    Comment Closes On
    Committee NTI/1
    Document Type Draft
    Publisher British Standards Institution
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    ISO 16700:2016 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
    ISO/TS 80004-3:2010 Nanotechnologies Vocabulary Part 3: Carbon nano-objects
    ISO 22493:2014 Microbeam analysis Scanning electron microscopy Vocabulary
    CEN/TS 15443:2006 Solid recovered fuels - Methods for laboratory sample preparation
    ISO Guide 35:2017 Reference materials Guidance for characterization and assessment of homogeneity and stability
    ISO 23833:2013 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
    ISO 14595:2014 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
    ISO 22309:2011 Microbeam analysis — Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
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