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    I.S. EN 61967-4:2002

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD

    Available format(s):  Hardcopy, PDF

    Superseded date:  21-05-2021

    Language(s):  English

    Published date:  01-01-2002

    Publisher:  National Standards Authority of Ireland

    For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
    Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

    Dates of withdrawal of national standards are available from NSAI.

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    Table of Contents - (Show below) - (Hide below)

    National Foreword
    FOREWORD
    1 Scope
    2 Normative references
    3 Definitions
    4 General
    5 Test conditions
    6 Test equipment
    7 Test set-up
    8 Test procedure
    9 Test report
    Annex A (normative) Probe calibration procedure
    Annex B (informative) Classification of conducted
                           emission levels
    Annex C (informative) Example of reference levels for
                           automotive applications
    Annex D (informative) EMC requirements and how to use
                           EMC IC measurement techniques
    Annex E (informative) Example of a test set-up consisting of
                           an EMC main test board and an EMC
                           IC test board
    Annex F (informative) 150 ohms direct coupling networks for
            common mode emission measurements of differential
            mode data transfer ICs and similar circuits
    Annex ZA (normative) Normative references to international
                           publications with their corresponding
                           European publications

    Abstract - (Show below) - (Hide below)

    Provides a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.

    General Product Information - (Show below) - (Hide below)

    Development Note AMD 1 2006 Re-issued on 02.03.2007 and incorporates corrigendum 2006. (03/2007) For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
    Document Type Standard
    Publisher National Standards Authority of Ireland
    Status Superseded
    Superseded By

    Standards Referencing This Book - (Show below) - (Hide below)

    EN 55016-1-4:2010/A2:2017 SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS AND METHODS - PART 1-4: RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS - ANTENNAS AND TEST SITES FOR RADIATED DISTURBANCE MEASUREMENTS (CISPR 16-1-4:2010/A2:2017)
    IEC 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
    CISPR 16-1-4:2010+AMD1:2012+AMD2:2017 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-4: Radio disturbance and immunity measuring apparatus - Antennas and test sites for radiated disturbance measurements
    CISPR 16-1-1:2015 Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-1: Radio disturbance and immunity measuring apparatus - Measuring apparatus
    CISPR 16-1-3:2004+AMD1:2016 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-3: Radio disturbance and immunity measuring apparatus - Ancillary equipment - Disturbance power
    CISPR 16-1-5:2014+AMD1:2016 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-5: Radio disturbance and immunity measuring apparatus - Antenna calibration sites and reference test sites for 5 MHz to 18 GHz
    EN 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
    IEC 61000-4-6 : 4.0 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-6: TESTING AND MEASUREMENT TECHNIQUES - IMMUNITY TO CONDUCTED DISTURBANCES, INDUCED BY RADIO-FREQUENCY FIELDS
    EN 55016-1-5:2015/A1:2017 SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS AND METHODS - PART 1-5: RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS - ANTENNA CALIBRATION SITES AND REFERENCE TEST SITES FOR 5 MHZ TO 18 GHZ (CISPR 16-1-5:2014/A1:2016)
    EN 55016-1-3:2006/A1:2016 SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS AND METHODS - PART 1-3: RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS - ANCILLARY EQUIPMENT - DISTURBANCE POWER (CISPR 16-1-3:2004)
    EN 61000-4-6:2014/AC:2015 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-6: TESTING AND MEASUREMENT TECHNIQUES - IMMUNITY TO CONDUCTED DISTURBANCES, INDUCED BY RADIO-FREQUENCY FIELDS (IEC 61000-4-6:2013)
    EN 55016-1-1:2010/A2:2014 SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS AND METHODS - PART 1-1: RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS - MEASURING APPARATUS (CISPR 16-1-1:2010/A2:2014)
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