IEC 60950-1:2005+AMD1:2009+AMD2:2013 CSV
|
Information technology equipment - Safety - Part 1: General requirements |
IEC GUIDE 107:2014
|
Electromagnetic compatibility - Guide to the drafting of electromagnetic compatibility publications |
EN 60825-1:2014/AC:2017-06
|
SAFETY OF LASER PRODUCTS - PART 1: EQUIPMENT CLASSIFICATION AND REQUIREMENTS (IEC 60825-1:2014) |
IEC 62007-1:2015
|
Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics |
IEC 60749-25:2003
|
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling |
IEC 61300-2-48:2009
|
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-48: Tests - Temperature-humidity cycling |
IEC 61290-1-3:2015
|
Optical amplifiers - Test methods - Part 1-3: Power and gain parameters - Optical power meter method |
IEC 60749-11:2002
|
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method |
EN 60950-1:2006/A2:2013
|
INFORMATION TECHNOLOGY EQUIPMENT - SAFETY - PART 1: GENERAL REQUIREMENTS (IEC 60950-1:2005/A2:2013, MODIFIED) |
IEC 60825-1:2014
|
Safety of laser products - Part 1: Equipment classification and requirements |
IEC 62007-2:2009
|
Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods |
EN 60749-11:2002
|
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method |
IEC 60749-26:2013
|
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) |
EN 60749-10:2002
|
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock |
IEC 60749-7:2011
|
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases |
EN 61300-2-4:1997
|
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-4: Tests - Fibre/cable retention |
IEC 60749-6:2017
|
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature |
IEC 62148-1:2017
|
Fibre optic active components and devices - Package and interface standards - Part 1: General and guidance |
EN 60749-7:2011
|
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases |
EN 60749-6:2017
|
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature |
EN 60749-26:2014
|
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) |
IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV
|
Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General |
IEC 61300-2-4:1995
|
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-4: Tests - Fibre/cable retention |
IEC 60749-10:2002
|
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock |
EN 60749-25:2003
|
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling |
IEC 62149-1:2011
|
Fibre optic active components and devices - Performance standards - Part 1: General and guidance |
IEC 61300-2-19:2012
|
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-19: Tests - Damp heat (steady state) |
EN 61300-2-19:2013
|
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-19: Tests - Damp heat (steady state) |
IEC 60749-12:2002
|
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency |
EN 61300-2-48:2009
|
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-48: Tests - Temperature-humidity cycling |
EN 60749-12:2002
|
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency |