• IEC 60300-3-7:1999

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    Dependability management - Part 3-7: Application guide - Reliability stress screening of electronic hardware

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Superseded date:  11-07-2007

    Language(s):  English - French, Spanish, Castilian

    Published date:  31-05-1999

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    Foreword
    Introduction
    1 Scope
    2 Normative references
    3 Definitions
    4 Acronyms
    5 General considerations for a reliability stress
        screening programme
    6 General information about the reliability stress
        screening process
    7 Analysis of the benefits of the reliability stress
        screening process
    8 Characteristics of a successful reliability stress
        screening programme
    9 Screening types
    10 Screening levels
    11 Screening strength
    12 Selection of screens
    13 Flaws detected by a reliability stress concerning
        process
    14 Pre-production screening process
    15 Planning, performing and eliminating a reliability
        stress screening process
        15.1 General
        15.2 Step 1 - Identification of objectives and
               goals
        15.3 Step 2 - Screening process design and
               application
        15.4 Step 3 - Cost-benefit analysis
        15.5 Step 4 - Preparation of a screening plan
        15.6 Step 5 - Screening process data collection,
               analysis and corrective actions
    Figures
    1 Levels where reliability stress screening can be
        performed
    2 Reliability stress screening of repairable items
    3 Flow chart for control of a reliability stress
        screening process
    A.1 Level chosen for the RSS process
    Tables
    A.1 Relation between the sensitivity of flaws and stresses
    Annex A (informative) RSS of repairable items produced
    in lots
    Annex B (informative) RSS of electronic components

    Abstract - (Show below) - (Hide below)

    Serves as an application guide to a reliability stress screening process for electronic hardware. The concept, purpose and justification of the screening process are explained. The standard is intended as a guide to be used with one of the IEC reliability stress screening standards. It gives guidance in cases where it is essential that early failures be removed from the items manufactured in order to deliver them to the customer when the problems causing the early failures are solved. It gives guidance on where the reliability stress screening should be carried out, i.e. component, subsystem or system level.

    General Product Information - (Show below) - (Hide below)

    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    CEI 56-46 : 2005 DEPENDABILITY MANAGEMENT - PART 3-5: APPLICATION GUIDE - RELIABILITY TEST CONDITIONS AND STATISTICAL TEST PRINCIPLES
    CEI EN 60300-3-2 : 2006 DEPENDABILITY MANAGEMENT - PART 3-2: APPLICATION GUIDE - COLLECTION OF DEPENDABILITY DATA FROM THE FIELD
    EN 60300-3-2 : 2005 Dependability management - Part 3-2: Application guide - Collection of dependability data from the field
    CEI 56-53 : 2006 DEPENDABILITY MANAGEMENT - PART 3-10: APPLICATION GUIDE - MAINTAINABILITY
    BS IEC 60300-3.5 : 2001 DEPENDABILITY MANAGEMENT - PART 3-5: APPLICATION GUIDE - RELIABILITY TEST CONDITIONS AND STATISTICAL TEST PRINCIPLES
    I.S. EN 60300-3-2:2005 DEPENDABILITY MANAGEMENT - PART 3-2: APPLICATION GUIDE - COLLECTION OF DEPENDABILITY DATA FROM THE FIELD
    04/30066208 DC : DRAFT DEC 2004 ISO 14224 - PETROLEUM AND NATURAL GAS INDUSTRIES - COLLECTION AND EXCHANGE OF RELIABILITY AND MAINTENANCE DATA FOR EQUIPMENT
    07/30144128 DC : 0 BS EN 60300-3-15 - DEPENDABILITY MANAGEMENT - PART 3-15: GUIDANCE TO ENGINEERING OF SYSTEM DEPENDABILITY
    CEI EN 60300-3-4 : 2010 DEPENDABILITY MANAGEMENT - PART 3-4: APPLICATION GUIDE - GUIDE TO THE SPECIFICATION OF DEPENDABILITY REQUIREMENTS
    BS EN 60300-3-2:2005 Dependability management Application guide. Collection of dependability data from the field
    IEC 60300-3-10:2001 Dependability management - Part 3-10: Application guide - Maintainability
    IEC 60300-3-2:2004 Dependability management - Part 3-2: Application guide - Collection of dependability data from the field
    BS IEC 61163-2:1998 Reliability stress screening Electronic components
    03/108624 DC : DRAFT JULY 2003 IEC 60300-3-2 - DEPENDABILITY MANAGEMENT - PART 3-2: APPLICATION GUIDE - COLLECTION OF DEPENDABILITY DATA FROM THE FIELD
    CEI 56-36 : 2000 RELIABILITY STRESS SCREENING - PART 2: ELECTRONIC COMPONENTS
    API 689 : 2007 COLLECTION AND EXCHANGE OF RELIABILITY AND MAINTENANCE DATA FOR EQUIPMENT
    IEC 60300-3-5:2001 Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles

    Standards Referencing This Book - (Show below) - (Hide below)

    MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
    MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
    IEC 61163-1:2006 Reliability stress screening - Part 1: Repairable assemblies manufactured in lots
    IEC 61163-2:1998 Reliability stress screening - Part 2: Electronic components
    IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
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