• IEC 60469:2013

    Current The latest, up-to-date edition.

    Transitions, pulses and related waveforms - Terms, definitions and algorithms

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English - French

    Published date:  23-04-2013

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms, definitions and symbols
    4 Measurement and analysis techniques
    5 Analysis algorithms for waveforms
    Annex A (informative) - Waveform examples
    Bibliography

    Abstract - (Show below) - (Hide below)

    IEC 60469:2013 provides definitions of terms pertaining to transitions, pulses, and related waveforms and provides definitions and descriptions of techniques and procedures for measuring their parameters. The waveforms considered in this standard are those that make a number of transitions and that remain relatively constant in the time intervals between transitions. Signals and their waveforms for which this standard apply include but are not limited to those used in:
    - digital communications, data communications, and computing;
    - studies of transient biological, cosmological, and physical events;
    - and electrical, chemical, and thermal pulses encountered and used in a variety of industrial, commercial, and consumer applications. This standard does not apply to sinusoidally-varying or other continuously-varying signals and their waveforms. The object of this standard is to facilitate accurate and precise communication concerning parameters of transitions, pulses, and related waveforms and the techniques and procedures for measuring them. IEC 60469:2013 combine the contents of IEC 60469-1 and IEC 60469-2. IEC 60469-1 dealt with terms and definitions for describing waveform parameters and IEC 60469-2 described the waveform measurement process. Other technical revisions include updating of terminology, errors correction, algorithms addition for computing values of pulse parameters, and addition of a newly-developed method for computing state levels. Changes to the definitions include adding new terms and definitions, deleting unused terms and definitions, expanding the list of deprecated terms, and updating and modifying existing definitions.

    General Product Information - (Show below) - (Hide below)

    Development Note Supersedes IEC 60469-1 and IEC 60469-2. Stability date: 2017. (04/2013)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    IEC 62884-3:2018 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
    BS EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
    BS EN 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement
    BS EN 60384-1:2016 Fixed capacitors for use in electronic equipment Generic specification
    I.S. EN 60679-1:2017 PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    IEC 60384-1:2016 RLV Fixed capacitors for use in electronic equipment - Part 1: Generic specification
    NF EN 62754 : 2017 COMPUTATION OF WAVEFORM PARAMETER UNCERTAINTIES
    EN 62884-2:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
    EN 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
    CEI EN 60679-1 : 2009 PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    I.S. EN 62884-2:2017 MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 2: PHASE JITTER MEASUREMENT METHOD
    17/30337173 DC : 0 BS EN 62884-4 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 4: SHORT-TERM FREQUENCY STABILITY TEST METHODS
    IEC 62754:2017 Computation of waveform parameter uncertainties
    EN 62754:2017 Computation of waveform Parameter uncertainties
    BS EN 62884-2:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method
    I.S. EN 62884-1:2017 MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT
    IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
    13/30261629 DC : 0 BS EN 62792 - ELECTROSHOCK WEAPON MEASUREMENT METHOD
    EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
    CEI EN 62754 : 1ED 2017 COMPUTATION OF WAVEFORM PARAMETER UNCERTAINTIES
    EN 60384-1:2016 Fixed capacitors for use in electronic equipment - Part 1: Generic specification
    IEC 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
    IEC 60384-1:2016 Fixed capacitors for use in electronic equipment - Part 1: Generic specification
    BS EN 62754:2017 Computation of waveform parameter uncertainties
    EN IEC 62884-3:2018 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods
    CEI EN 62884-1 : 1ED 2018 MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT
    I.S. EN 62754:2017 COMPUTATION OF WAVEFORM PARAMETER UNCERTAINTIES
    IEC 62792:2015 Measurement method for the output of electroshock weapons
    IEC 60384-1 REDLINE : 5ED 2016 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION

    Standards Referencing This Book - (Show below) - (Hide below)

    IEEE 270-2006 IEEE Standard Definitions for Selected Quantities, Units, and Related Terms, with Special Attention to the International System of Units (SI)
    IEEE/ASTM SI_10-2010 American National Standard for Metric Practice
    ISO/IEC Guide 99:2007 International vocabulary of metrology Basic and general concepts and associated terms (VIM)
    ISO 10012:2003 Measurement management systems — Requirements for measurement processes and measuring equipment
    ISO 9000:2015 Quality management systems — Fundamentals and vocabulary
    ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)
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