17/30355772 DC : 0
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BS EN 62047-33 ED.1.0 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 33: MEMS PIEZORESISTIVE PRESSURE-SENSITIVE DEVICE |
BS EN 62149-2:2014
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Fibre optic active components and devices. Performance standards 850 nm discrete vertical cavity surface emitting laser devices |
13/30277888 DC : 0
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BS EN 62149-2 ED 2.0 - FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 2: 850 NM DISCRETE VERTICAL CAVITY SURFACE EMITTING LASER DEVICES |
BS EN 60749-43:2017
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Semiconductor devices - Mechanical and climatic test methods Guidelines for IC reliability qualification plans |
I.S. EN 62572-3:2016
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FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - RELIABILITY STANDARDS - PART 3: LASER MODULES USED FOR TELECOMMUNICATION |
IEC 60749-43:2017
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Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans |
CEI EN 60747-15 : 2012
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SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES |
EN 60747-15:2012
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Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices |
EN 62149-8:2014
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Fibre optic active components and devices - Performance standards - Part 8: Seeded reflective semiconductor optical amplifier devices |
IEC 60747-14-4:2011
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Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers |
BS EN 62149-8:2014
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Fibre optic active components and devices. Performance standards Seeded reflective semiconductor optical amplifier devices |
BS IEC 60747-14-5:2010
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Semiconductor devices Semiconductor sensors. PN-junction semiconductor temperature sensor |
I.S. EN 60747-15:2012
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SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES (IEC 60747-15:2010 (EQV)) |
I.S. EN 62149-8:2014
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FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 8: SEEDED REFLECTIVE SEMICONDUCTOR OPTICAL AMPLIFIER DEVICES |
EN 60749-43:2017
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Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans |
07/30162213 DC : 0
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BS EN 60747-15 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES |
BS IEC 60747-14-4:2011
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Semiconductor devices. Discrete devices Semiconductor accelerometers |
15/30323391 DC : 0
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BS EN 62572-3 - FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - RELIABILITY STANDARDS PART 3: LASER MODULES USED FOR TELECOMMUNICATION |
13/30277892 DC : 0
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BS EN 62572-3 ED 2.0 - FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - RELIABILITY STANDARDS - PART 3: LASER MODULES USED FOR TELECOMMUNICATION |
BS EN 60747-15:2012
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Semiconductor devices. Discrete devices Isolated power semiconductor devices |
IEC TS 62686-1:2015
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Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors |
13/30264591 DC : 0
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BS EN 60747-14-6 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-6: SEMICONDUCTOR SENSORS - HUMIDITY SENSOR |
BS EN 62572-3:2016
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Fibre optic active components and devices. Reliability standards Laser modules used for telecommunication |
13/30277845 DC : 0
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BS EN 62149-8 ED 1.0 - FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARD - PART 8: SEEDED REFLECTIVE SEMICONDUCTOR OPTICAL AMPLIFIER DEVICES |
15/30269562 DC : 0
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BS EN 60749-43 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 43: GUIDELINES FOR LSI RELIABILITY QUALIFICATION PLANS |
13/30264600 DC : 0
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BS EN 60747-14-8 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-8: SEMICONDUCTOR SENSORS - CAPACITIVE DEGRADATION SENSOR OF LIQUID |
IEC 60747-14-5:2010
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Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor |
CEI EN 60749-43 : 1ED 2018
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 43: GUIDELINES FOR IC RELIABILITY QUALIFICATION PLANS |
IEC 62572-3:2016
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Fibre optic active components and devices - Reliability standards - Part 3: Laser modules used for telecommunication |
IEC 62149-2:2014
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Fibre optic active components and devices - Performance standards - Part 2: 850 nm discrete vertical cavity surface emitting laser devices |
PD IEC/TS 62686-1:2015
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Process management for avionics. Electronic components for aerospace, defence and high performance (ADHP) applications General requirements for high reliability integrated circuits and discrete semiconductors |
13/30264596 DC : 0
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BS EN 60747-14-7 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-7: SEMICONDUCTOR SENSORS - FLOW METER |
I.S. EN 62149-2:2014
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FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 2: 850 NM DISCRETE VERTICAL CAVITY SURFACE EMITTING LASER DEVICES |
I.S. EN 60749-43:2017
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 43: GUIDELINES FOR IC RELIABILITY QUALIFICATION PLANS |
IEC 60747-5-6:2016
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Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes |
IEC 62149-8:2014
|
Fibre optic active components and devices - Performance standards - Part 8: Seeded reflective semiconductor optical amplifier devices |
IEC 60747-15:2010
|
Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices |
EN 62572-3:2016
|
Fibre optic active components and devices - Reliability standards - Part 3: Laser modules used for telecommunication |
EN 62149-2:2014
|
Fibre optic active components and devices - Performance standards - Part 2: 850 nm discrete vertical cavity surface emitting laser devices |