• IEC TR 61967-1-1:2015

    Current The latest, up-to-date edition.

    Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English

    Published date:  28-08-2015

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms, definitions and abbreviations
    4 General syntax rules and guidelines
    Annex A (informative) - Example files
    Annex B (normative) - Valid keywords
    Annex C (normative) - Keyword usage rules
    Bibliography

    Abstract - (Show below) - (Hide below)

    IEC TR 61967-1-1:2015(E) provides guidance for exchanging data generated by near-field scan measurements. The described exchange format could also be used for near-field scan data generated by simulation or computation software. It should be noted that, although it has been developed for near-field scan, its use is not restricted to this application. The exchange format can be applied to emission and immunity near-field scan data in the frequency and time domains. The scope of this technical report includes neither the methods used for the measurements or simulations, nor the software and algorithms used for generating the exchange file or for processing or viewing the data contained therein. This edition includes the following significant changes with respect to the previous edition:
    - Addition of: 3D objects; Binary data files; Piece-wise linear time domain and frequency domain data; Vectors permitting rotation and offset of measurement and DUT reference planes; Transducer gain and probe factor can be complex; New keywords: Object3d, Mapobj, Maxhold, Datafileformat, Vx, Vy, Vz, Target, Software, Data_source.
    - Updating of: Probe factor and corresponding keywords.
    - Modification of: Keywords: Average.

    General Product Information - (Show below) - (Hide below)

    Committee TC 47/SC 47A
    Development Note Stability Date: 2020. (09/2015)
    Document Type Technical Report
    Publisher International Electrotechnical Committee
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    PD IEC/TS 61967-3:2014 Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. Surface scan method
    PD IEC/TS 62132-9:2014 Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. Surface scan method
    IEC TS 61967-3:2014 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
    IEC TS 62132-9:2014 Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60050-131:2002 International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory
    IEC TS 62132-9:2014 Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method
    IEC 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
    IEC TS 61967-3:2014 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
    IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
    ISO 8879:1986 Information processing Text and office systems Standard Generalized Markup Language (SGML)
    IEEE 754-2008 REDLINE IEEE Standard for Floating-Point Arithmetic
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