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  • IEEE C62.35-2010

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components

    Available format(s):  PDF

    Superseded date:  20-10-2021

    Language(s):  English

    Published date:  31-08-2010

    Publisher:  Institute of Electrical & Electronics Engineers

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    Table of Contents - (Show below) - (Hide below)

    1. Scope
    2. Definitions
    3. V-I Characteristics for a unidirectional ABD
    4. Circuit symbols
    5. Service conditions
    6. Standard design test procedures
    7. Failures and fault modes
    8. Derived parameters and other test procedures
    Annex A (informative) - Bibliography

    Abstract - (Show below) - (Hide below)

    Pertains to two terminal or multiple terminal silicon avalanche breakdown diodes (ABD), which are one type of surge protective device component (SPDC). Covers terms, symbols and definitions, and gives test methods for verifying ratings and measuring device characteristics.

    General Product Information - (Show below) - (Hide below)

    Committee Surge Protective Devices/Low Voltage
    Document Type Standard
    Product Note NEW CHILD COR 1 IS NOW ADDED
    Publisher Institute of Electrical & Electronics Engineers
    Status Superseded
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    IEEE C62.36-2014 REDLINE IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits
    IEEE C62.42-2005 IEEE Guide for the Application of Component Surge-Protective Devices for Use in Low-Voltage [Equal to or Less than 1000 V (ac) Or 1200 V (dc)] Circuits
    IEEE C62.23-1995 IEEE Application Guide for Surge Protection of Electric Generating Plants
    IEEE C62.42.0-2016 IEEE Guide for the Application of Surge-Protective Components in Surge-Protective Devices and Equipment Ports--Overview
    IEEE C62.43.0-2017 IEEE Guide for Surge Protectors and Protective Circuits Used in Information and Communications Technology Circuits, Including Smart Grid Data Networks--Overview
    IEEE C62.37 : 1996 TEST SPECIFICATION FOR THYRISTOR DIODE SURGE PROTECTIVE DEVICES

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 61643-321:2001 Components for low-voltage surge protective devices - Part 321: Specifications for avalanche breakdown diode (ABD)
    IEC 60068-2-18:2017 Environmental testing - Part 2-18: Tests - Test R and guidance: Water
    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
    IEC 60749-5:2017 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
    IEC 60068-2-57:2013 Environmental testing - Part 2-57: Tests - Test Ff: Vibration - Time-history and sine-beat method
    IEC 60068-2-64:2008 Environmental testing - Part 2-64: Tests - Test Fh: Vibration, broadband random and guidance
    IEC 60695-2-13:2010+AMD1:2014 CSV Fire hazard testing - Part 2-13: Glowing/hot-wire based test methods- Glow-wire ignition temperature (GWIT) test method for materials
    IEC 60068-2-38:2009 Environmental testing - Part 2-38: Tests - Test Z/AD: Composite temperature/humidity cyclic test
    IEC 60749-33:2004 Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
    IEC 60068-2-47:2005 Environmental testing - Part 2-47: Test - Mounting of specimens for vibration, impact and similar dynamic tests
    IEC 61643-1:2005 Low-voltage surge protective devices - Part 1: Surge protective devices connected to low-voltage power distribution systems - Requirements and tests
    IEC 61051-2:1991 Varistors for use in electronic equipment - Part 2: Sectional specification for surge suppression varistors
    IEC 60068-2-29:1987 Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
    IEC 61180-1:1992 High-voltage test techniques for low voltage equipment - Part 1: Definitions, test and procedure requirements
    IEC 60060-1:2010 High-voltage test techniques - Part 1: General definitions and test requirements
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    IEC 60664-1:2007 Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests
    IEC 60068-2-52:2017 Environmental testing - Part 2-52: Tests - Test Kb: Salt mist, cyclic (sodium chloride solution)
    IEC 60068-2-65:2013 Environmental testing - Part 2-65: Tests - Test Fg: Vibration - Acoustically induced method
    IEC 61051-1:2007 Varistors for use in electronic equipment - Part 1: Generic specification
    IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
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