Specifies guidance on different issues that impact SIL verification: - Assessing random and systematic failures, classifying failure modes, and estimating the failure rates for individual devices of an SIF; - Assessing the impact of diagnostic and mechanical integrity choices on the performance of the SIF and its devices; - Assessing and estimating the potential for common cause and common mode failures; and - Verifying that the SIF achieves a specified SIL and spurious trip rate.