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ISO/TS 10797:2012
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Nanotechnologies Characterization of single-wall carbon nanotubes using transmission electron microscopy |
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ISO/TS 13278:2011
|
Nanotechnologies Determination of elemental impurities in samples of carbon nanotubes using inductively coupled plasma mass spectrometry |
|
ISO 16700:2016
|
Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification |
|
ISO 22412:2017
|
Particle size analysis — Dynamic light scattering (DLS) |
|
ISO 13099-3:2014
|
Colloidal systems Methods for zeta potential determination Part 3: Acoustic methods |
|
ISO 25498:2010
|
Microbeam analysis Analytical electron microscopy Selected-area electron diffraction analysis using a transmission electron microscope |
|
ISO 13320:2009
|
Particle size analysis Laser diffraction methods |
|
ISO 13318-2:2007
|
Determination of particle size distribution by centrifugal liquid sedimentation methods Part 2: Photocentrifuge method |
|
ISO/TS 10868:2017
|
Nanotechnologies — Characterization of single-wall carbon nanotubes using ultraviolet-visible-near infrared (UV-Vis-NIR) absorption spectroscopy |
|
ISO 13318-1:2001
|
Determination of particle size distribution by centrifugal liquid sedimentation methods Part 1: General principles and guidelines |
|
ISO/TS 14101:2012
|
Surface characterization of gold nanoparticles for nanomaterial specific toxicity screening: FT-IR method |
|
ASTM E 2530 : 2006
|
Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps (Withdrawn 2015) |
|
ISO 18118:2015
|
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials |
|
ISO/TS 80004-6:2013
|
Nanotechnologies Vocabulary Part 6: Nano-object characterization |
|
ISO 13099-1:2012
|
Colloidal systems — Methods for zeta-potential determination — Part 1: Electroacoustic and electrokinetic phenomena |
|
ISO 22493:2014
|
Microbeam analysis Scanning electron microscopy Vocabulary |
|
ISO 15472:2010
|
Surface chemical analysis X-ray photoelectron spectrometers Calibration of energy scales |
|
ISO 29301:2010
|
Microbeam analysis Analytical transmission electron microscopy Methods for calibrating image magnification by using reference materials having periodic structures |
|
ISO 18115-1:2013
|
Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy |
|
ISO 15202-3:2004
|
Workplace air Determination of metals and metalloids in airborne particulate matter by inductively coupled plasma atomic emission spectrometry Part 3: Analysis |
|
ISO/TR 13014:2012
|
Nanotechnologies Guidance on physico-chemical characterization of engineered nanoscale materials for toxicologic assessment |
|
ISO 26824:2013
|
Particle characterization of particulate systems — Vocabulary |
|
ISO 11357-5:2013
|
Plastics — Differential scanning calorimetry (DSC) — Part 5: Determination of characteristic reaction-curve temperatures and times, enthalpy of reaction and degree of conversion |
|
ASTM B 922 : 2017 : REDLINE
|
Standard Test Method for Metal Powder Specific Surface Area by Physical Adsorption |
|
ISO/TR 13097:2013
|
Guidelines for the characterization of dispersion stability |
|
ISO/TS 17466:2015
|
Use of UV-Vis absorption spectroscopy in the characterization of cadmium chalcogenide colloidal quantum dots |
|
ISO 21270:2004
|
Surface chemical analysis X-ray photoelectron and Auger electron spectrometers Linearity of intensity scale |
|
ISO 11039:2012
|
Surface chemical analysis — Scanning-probe microscopy — Measurement of drift rate |
|
ISO 11357-3:2011
|
Plastics Differential scanning calorimetry (DSC) Part 3: Determination of temperature and enthalpy of melting and crystallization |
|
ISO 11357-2:2013
|
Plastics Differential scanning calorimetry (DSC) Part 2: Determination of glass transition temperature and glass transition step height |
|
ISO 11357-4:2014
|
Plastics Differential scanning calorimetry (DSC) Part 4: Determination of specific heat capacity |
|
ISO 13321:1996
|
Particle size analysis Photon correlation spectroscopy |
|
ISO/IEC Guide 99:2007
|
International vocabulary of metrology Basic and general concepts and associated terms (VIM) |
|
ISO 20998-2:2013
|
Measurement and characterization of particles by acoustic methods — Part 2: Guidelines for linear theory |
|
ISO 3252:1999
|
Powder metallurgy Vocabulary |
|
ISO 13067:2011
|
Microbeam analysis Electron backscatter diffraction Measurement of average grain size |
|
ISO 15901-2:2006
|
Pore size distribution and porosity of solid materials by mercury porosimetry and gas adsorption Part 2: Analysis of mesopores and macropores by gas adsorption |
|
ASTM E 984 : 2012 : REDLINE
|
Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy |
|
ISO/TS 19590:2017
|
Nanotechnologies Size distribution and concentration of inorganic nanoparticles in aqueous media via single particle inductively coupled plasma mass spectrometry |
|
ISO 16531:2013
|
Surface chemical analysis Depth profiling Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS |
|
ISO 472:2013
|
Plastics Vocabulary |
|
ISO 15470:2017
|
Surface chemical analysis — X-ray photoelectron spectroscopy — Description of selected instrumental performance parameters |
|
ISO/TS 11888:2017
|
Nanotechnologies — Characterization of multiwall carbon nanotubes — Mesoscopic shape factors |
|
ISO 18516:2006
|
Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Determination of lateral resolution |
|
ASTM E 1217 : 2011 : REDLINE
|
Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers |
|
ISO/TR 19319:2013
|
Surface chemical analysis Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods |
|
ISO 18757:2003
|
Fine ceramics (advanced ceramics, advanced technical ceramics) Determination of specific surface area of ceramic powders by gas adsorption using the BET method |
|
ISO 14644-1:2015
|
Cleanrooms and associated controlled environments Part 1: Classification of air cleanliness by particle concentration |
|
ISO 19318:2004
|
Surface chemical analysis X-ray photoelectron spectroscopy Reporting of methods used for charge control and charge correction |
|
ISO/TS 80004-1:2015
|
Nanotechnologies — Vocabulary — Part 1: Core terms |
|
ISO 11357-6:2008
|
Plastics Differential scanning calorimetry (DSC) Part 6: Determination of oxidation induction time (isothermal OIT) and oxidation induction temperature (dynamic OIT) |
|
ISO 20998-1:2006
|
Measurement and characterization of particles by acoustic methods Part 1: Concepts and procedures in ultrasonic attenuation spectroscopy |
|
ISO 17751:2007
|
Textiles Quantitative analysis of animal fibres by microscopy Cashmere, wool, speciality fibres and their blends |
|
ISO 24237:2005
|
Surface chemical analysis — X-ray photoelectron spectroscopy — Repeatability and constancy of intensity scale |
|
ISO/TR 14187:2011
|
Surface chemical analysis Characterization of nanostructured materials |
|
ASTM C 1274 : 2012 : REDLINE
|
Standard Test Method for Advanced Ceramic Specific Surface Area by Physical Adsorption |
|
ISO 18115-2:2013
|
Surface chemical analysis Vocabulary Part 2: Terms used in scanning-probe microscopy |
|
ISO/TS 11308:2011
|
Nanotechnologies Characterization of single-wall carbon nanotubes using thermogravimetric analysis |
|
ISO 13318-3:2004
|
Determination of particle size distribution by centrifugal liquid sedimentation methods Part 3: Centrifugal X-ray method |
|
ISO 24173:2009
|
Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction |
|
ISO 17867:2015
|
Particle size analysis Small-angle X-ray scattering |
|
ISO/TR 18392:2005
|
Surface chemical analysis X-ray photoelectron spectroscopy Procedures for determining backgrounds |
|
ISO/TS 80004-4:2011
|
Nanotechnologies — Vocabulary — Part 4: Nanostructured materials |
|
ISO 11357-1:2016
|
Plastics — Differential scanning calorimetry (DSC) — Part 1: General principles |
|
ISO/TS 10798:2011
|
Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis |
|
ISO 22309:2011
|
Microbeam analysis — Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above |
|
ISO 9277:2010
|
Determination of the specific surface area of solids by gas adsorption — BET method |
|
ISO 9276-6:2008
|
Representation of results of particle size analysis — Part 6: Descriptive and quantitative representation of particle shape and morphology |
|
ISO 15901-1:2016
|
Evaluation of pore size distribution and porosity of solid materials by mercury porosimetry and gas adsorption Part 1: Mercury porosimetry |
|
ISO 27891:2015
|
Aerosol particle number concentration — Calibration of condensation particle counters |
|
ISO 13099-2:2012
|
Colloidal systems — Methods for zeta-potential determination — Part 2: Optical methods |
|
ISO 11357-7:2015
|
Plastics Differential scanning calorimetry (DSC) Part 7: Determination of crystallization kinetics |
|
ISO 15632:2012
|
Microbeam analysis Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis |
|
ISO 9276-2:2014
|
Representation of results of particle size analysis Part 2: Calculation of average particle sizes/diameters and moments from particle size distributions |
|
ISO 15900:2009
|
Determination of particle size distribution Differential electrical mobility analysis for aerosol particles |
|
ISO 20903:2011
|
Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Methods used to determine peak intensities and information required when reporting results |
|
ISO/TS 80004-2:2015
|
Nanotechnologies — Vocabulary — Part 2: Nano-objects |