MIL M 64020D : 1989
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MICROCIRCUIT, AMPLIFIER, BIPOLAR, HIGH FREQUENCY, FRONT END |
MIL-B-117G:1993
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BAG, SLEEVE AND TUBING |
MIL-STD-129 Revision R:2014
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Military Marking for Shipment and Storage |
MIL-STD-883 Revision K:2016
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TEST METHOD STANDARD - MICROCIRCUITS |
MIL S 19500/356 : D
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SEMICONDUCTOR DEVICE, DIODE, SILICON, VOLTAGE REGULATOR TYPES 1N4954 THROUGH 1N4996, 1N5968 AND 1N5969 JAN, JANTX, JANTXV AND JANS |
MIL-R-39008-2 Revision F:1989
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RESISTORS FIXED, COMPOSITION (INSULATED) ESTABLISHED RELIABILITY STYLE RCR20 |
MIL-STD-810 Revision G:2008
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ENVIRONMENTAL ENGINEERING CONSIDERATIONS AND LABORATORY TESTS |
MIL S 19500/445 : C
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SEMICONDUCTOR DEVICE, DIODE, SILICON, SWITCHING TYPE 1N5712 JAN, JANTX, JANTXV, AND JANS |
MIL R 39017/1 : N (3)
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RESISTOR, FIXED, FILM (INSULATED) ESTABLISHED RELIABILITY RLR07 |
MIL-P-14232 Revision E:1976
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PARTS, EQUIPMENT AND TOOLS FOR ARMY MATERIAL, PACKAGING OF |
MIL-M-48646 Base Document:1986
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MICROCIRCUIT, DIGITAL, SCO/DLA MULTICHIP CMOS |
MIL-F-18327 Revision F:2008
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FILTERS; HIGH PASS, LOW PASS, BAND PASS, BAND SUPPRESSION, AND DUAL FUNCTIONING, GENERAL SPECIFICATION FOR |
MIL S 19500/427 : E
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SEMICONDUCTOR DEVICE, DIODE, SILICON, POWER RECTIFIER TYPES 1N5614, 1N5616, 1N5618, 1N5620, 1N5622 JAN, JANTX, JANTXV, AND JANS |
DOD STD 1686 : 0
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ELECTROSTATIC DISCHARGE CONTROL PROGRAM FOR PROTECTION OF ELECTRICAL AND ELECTRONIC PARTS ASSEMBLIES AND EQUIPMENT (EXCLUDING ELECTRICALLY INITIATED EXPLOSIVE DEVICES)(METRIC) |
MIL C 39014/5 : E (4)
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CAPACITOR, FIXED, CERAMIC DIELECTRIC (GENERAL PURPOSE) ESTABLISHED RELIABILITY, STYLES CLR11, CKR12, CKR14, CKR15 & CKR16. |
MIL-STD-750 Revision F:2011
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TEST METHODS FOR SEMICONDUCTOR DEVICES |
MIL S 19500/420 : D
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SEMICONDUCTOR DEVICE, DIODE, SILICON, POWER, RECTIFIER, GENERAL PURPOSE TYPES 1N5550 TO N5554 JAN, JANTX, JANTXV, AND JANS |
MIL C 39001/5 : B
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CAPACITOR, FIXED, MICA DIELECTRIC, ESTABLISHED RELIABILITY, STYLES CMR03 THRU CMR08 |
MIL L 7961 : C
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LIGHT, INDICATOR, PRESS TO TEST |
MIL C 39014/2 : J
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|
MIL C 14409 : D
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CAPACITOR, VARIABLE (PISTON TYPE, TUBULAR TRIMMER), GENERAL SPECIFICATION FOR |
MIL S 19500/108 : E
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SEMICONDUCTOR DEVICE, THYRISTORS (CONTROLLED RECTIFIERS), SILICON TYPES 2N682, 2N683, 2N685 THROUGH 2N692, 2N5206, TX2N682, TX2N683, TX2N685 THROUGH TX2N692 AND TX2N5206 |
DOD HDBK 263 : LATEST
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ELECTROSTATIC DISCHARGE CONTROL HANDBOOK FOR PROTECTION OF ELECTRICAL AND ELECTRONIC PARTS, ASSEMBLIES AND EQUIPMENT (EXCLUDING ELECTRICALLY INITIATED EXPLOSIVE DEVICES)METRIC |
MIL-R-39008-1 Revision F:1989
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RESISTORS FIXED, COMPOSITION (INSULATED) ESTABLISHED RELIABILITY STYLE RCR07 |
MIL C 3098 : G
|
CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR |
MIL S 19500/477 : B
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SEMICONDUCTOR DEVICE, DIODE, SILICON, FAST RECOVERY, POWER RECTIFIER, TYPES 1N5802, IN5804, 1N5806, 1N5807, 1N5809 AND 1N5811, 1N5802US, 1N5804US, 1N5806US, 1N5809US, AND 1N5811US, JAN, JANTX, JANTXV, JANJ, JANS, JANHC, AND JANKC |
MIL C 39003/1 : G
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CAPACITOR, FIXED, ELECTROLYTIC (SOLID ELECTROLYTE), TANTALUM, (POLARIZED, SINTERED SLUG), ESTABLISHED RELIABILITY, STYLE CSR 13 |
MIL S 19500 : J
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SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
MIL-A-48078 Revision A:1988
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AMMUNITION, STANDARD QUALITY ASSURANCE PROVISIONS, GENERAL SPECIFICATION FOR |
MIL S 19500/117 : K
|
SEMICONDUCTOR DEVICES, DIODE, SILICON, VOLTAGE REGULATOR TYPES 1N962B THROUGH 1N992B, 1N962B-1 THROUGH 1N992B-1, JAN, JANTX, JANTXV AND JANS |
MIL-S-46844 Revision C:1976
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SOLDER BATH SOLDERING OF PRINTED WIRING ASSEMBLIES |
MIL-STD-202 Revision H:2015
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ELECTRONIC AND ELECTRICAL COMPONENT PARTS |
MIL S 19500/255 : H (1)
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SEMICONDUCTOR DEVICE, TRANSISTOR NPN, SILICON, SWITCHING, TYPES 2N2221A, 2N2222A, 2N2221AUA, 2N2222AUA, 2N2221AUB, AND 2N2222AUB, JAN, JANTX, JANTXV, JANTXVD, JANTXVH, JANTXVM, JANTXVR, JANS, JANSD, JANSH, JANSM, JANSR, JANHC, AND JANKC |
MIL C 39014/22 : C
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CAPACITOR, FIXED, CERAMIC DIELECTRIC (GENERAL PURPOSE) ESTABLISHED RELIABILITY, STYLE CKR22, CKR23 & CKR24 |
MIL-STD-331 Revision D:2017
|
FUZES, IGNITION SAFETY DEVICES AND OTHER RELATED COMPONENTS, ENVIRONMENTAL AND PERFORMANCE TESTS FOR |
PPP-B-621 Revision D:1981
|
BOXES, WOOD, NAILED AND LOCK CORNER |
MIL-M-48647 Base Document:1986
|
MICROCIRCUIT, DIGITAL, DECODER, LOGIC ARRAY |
MIL-STD-105 Revision E:1989
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SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY ATTRIBUTES |
MIL-E-17555 Revision H:1984
|
ELECTRONIC AND ELECTRICAL EQUIPMENT, ACCESSORIES, AND PROVISIONED ITEMS (REPAIR PARTS); PACKAGING OF |