• MIL-HDBK-280 Base Document:1985

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    NEUTRON HARDNESS ASSURANCE GUIDELINES FOR SEMICONDUCTOR DEVICES AND MICROCIRCUITS

    Available format(s):  PDF

    Superseded date:  20-12-2001

    Language(s): 

    Published date: 

    Publisher:  US Military Specs/Standards/Handbooks

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    Abstract - (Show below) - (Hide below)

    Covers neutron radiation effects on piece-part semiconductor microcircuits and devices; hardness assurance.

    General Product Information - (Show below) - (Hide below)

    Development Note NOTICE 1 - Notice of Cancellation/Superseded by MIL HDBK 814. (09/2004)
    Document Type Standard
    Publisher US Military Specs/Standards/Handbooks
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    MIL-STD-989 Base Document:1991 CERTIFICATION REQUIREMENTS FOR JAN SEMICONDUCTOR DEVICES
    MIL-HDBK-817 Base Document:1994 SYSTEM DEVELOPMENT RADIATION HARDNESS ASSURANCE
    MIL-HDBK-816 Base Document:1994 Guidelines for Developing Radiation Hardness Assurance Device Specifications
    MIL-HDBK-815 Base Document:1994 DOSE-RATE HARDNESS ASSURANCE GUIDELINES

    Standards Referencing This Book - (Show below) - (Hide below)

    MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
    MIL-M-38510 Revision J:1991 MICROCIRCUITS, SPECIFICATION FOR
    MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
    MIL S 19500 : J SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
    MIL C 45662 : 0 CALIBRATION SYSTEM REQUIREMENTS
    MIL-STD-202 Revision H:2015 ELECTRONIC AND ELECTRICAL COMPONENT PARTS
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