Skip to content
Please enter a keyword to search

  • MIL-HDBK-815 Base Document:1994

    Current The latest, up-to-date edition.

    DOSE-RATE HARDNESS ASSURANCE GUIDELINES

    Available format(s):  PDF

    Language(s): 

    Published date: 

    Publisher:  US Military Specs/Standards/Handbooks

    Add To Cart

    Abstract - (Show below) - (Hide below)

    Primarily discusses piece-part hardness assurance methods for the dose-rate environment.

    General Product Information - (Show below) - (Hide below)

    Committee FSC 59GP
    Development Note CHANGE 1 - Notice of Change. (01/2002) NOTICE 1 - Notice of Validation. (11/2006) NOTICE 3 - Notice of Validation. NOTICE 4 - Notice of Validation. (08/2017)
    Document Type Standard
    Publisher US Military Specs/Standards/Handbooks
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    MIL-HDBK-817 Base Document:1994 SYSTEM DEVELOPMENT RADIATION HARDNESS ASSURANCE
    MIL-PRF-38535 Revision K:2013 Integrated Circuits (Microcircuits) Manufacturing, General Specification for
    MIL-PRF-38534 Revision K:2017 HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR

    Standards Referencing This Book - (Show below) - (Hide below)

    ASTM E 665 : 1994 Practice for Using Absorbed Dose Versus Depth in Materials to Verify the X-ray Output of Flash X-ray Machines (Withdrawn 2000)
    MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
    ASTM F 526 : 2016 : REDLINE Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines
    MIL-STD-45662 Revision A:1988 CALIBRATION SYSTEMS REQUIREMENTS
    MIL-HDBK-279 Base Document:1985 TOTAL DOSE HARDNESS ASSURANCE GUIDELINE FOR SEMICONDUCTOR DEVICE & MICROCIRCUIT
    ASTM F 675 : 1991 Test Method for Measuring Nonequilibrium Transient Photocurrents in P-N Junctions (Withdrawn 1995)
    MIL-M-38510 Revision J:1991 MICROCIRCUITS, SPECIFICATION FOR
    MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
    MIL I 38535 : B (1) INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
    ASTM E 668 : 2013 : REDLINE Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
    MIL-HDBK-816 Base Document:1994 Guidelines for Developing Radiation Hardness Assurance Device Specifications
    MIL S 19500 : J SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
    MIL-STD-202 Revision H:2015 ELECTRONIC AND ELECTRICAL COMPONENT PARTS
    DODISS : 1999 DEPARTMENT OF DEFENSE INDEX OF STANDARDS AND SPECIFICATIONS
    MIL-HDBK-280 Base Document:1985 NEUTRON HARDNESS ASSURANCE GUIDELINES FOR SEMICONDUCTOR DEVICES AND MICROCIRCUITS
    ASTM E 666 : 2014 : REDLINE Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
    ASTM F 448 : 2011-07 TEST METHOD FOR MEASURING STEADY-STATE PRIMARY PHOTOCURRENT
    ASTM E 820 : 1981 Practice for Determining Absolute Absorbed Dose Rates for Electron Beams (Withdrawn 1987)
    ASTM F 773 : 1992 Practice for Measuring Dose Rate Response of Linear Integrated Circuits
    View more information

    • Access your standards online with a subscription

      Features

      • Simple online access to standards, technical information and regulations
      • Critical updates of standards and customisable alerts and notifications
      • Multi - user online standards collection: secure, flexibile and cost effective