• MIL-PRF-19500-343 Revision M:2016

    Current The latest, up-to-date edition.

    RF Transistor, NPN, Silicon, Low Power, Encapsulated (Through-Hole and Surface Mount), and Unencapsulated, Radiation Hardness Assurance, Types 2N2857, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, and JANKC

    Available format(s):  PDF

    Language(s): 

    Published date:  03-11-2016

    Publisher:  US Military Specs/Standards/Handbooks

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    Table of Contents - (Show below) - (Hide below)

    1. SCOPE
    2. APPLICABLE DOCUMENTS
    3. REQUIREMENTS
    4. VERIFICATION
    5. PACKAGING
    6. NOTES

    Abstract - (Show below) - (Hide below)

    Specifies the performance requirements for NPN, silicon, low power, ultra-high frequency transistors.

    Scope - (Show below) - (Hide below)

    This specification covers the performance requirements for NPN, silicon, low power, ultra-high frequency transistors. Four levels of product assurance (JAN, JANTX, JANTXV and JANS) are provided for each device type. Two levels of product assurance (JANHC and JANKC) are provided for unencapsulated devices as specified in MIL-PRF-19500. RHA level designators “M”, “D”, “P“, “L”, “R”, “F”, “G”, and “H” are appended to the device prefix to identify devices, which have passed RHA requirements.

    General Product Information - (Show below) - (Hide below)

    Development Note Supersedes MIL S 19500/343 (C). (02/2000)
    Document Type Standard
    Publisher US Military Specs/Standards/Handbooks
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    MIL-PRF-19500 Revision P:2010 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
    MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
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