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  • MIL-PRF-19500-356 Revision L:2014

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    Semiconductor Device, Diode, Silicon, Voltage Regulator, Types 1N4954 Through 1N4996, 1N5968, 1N5969, and 1N6632 Through 1N6637, Encapsulated (Axial Leaded and Surface Mount Package) and Unencapsulated, 5, 2, and 1 Percent Voltage Tolerance, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC and JANKC

    Available format(s):  PDF

    Superseded date:  27-07-2019

    Language(s):  English

    Published date:  27-06-2014

    Publisher:  US Military Specs/Standards/Handbooks

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    Table of Contents - (Show below) - (Hide below)

    1. SCOPE
    2. APPLICABLE DOCUMENTS
    3. REQUIREMENTS
    4. VERIFICATION
    5. PACKAGING
    6. NOTES

    Abstract - (Show below) - (Hide below)

    Specifies the performance requirements for silicon, voltage regulator diodes.

    Scope - (Show below) - (Hide below)

    This specification covers the performance requirements for silicon, voltage regulator diodes with
    voltage tolerances of 5 percent, 2 percent, and 1 percent. Four levels of product assurance (JAN, JANTX, JANTXV, and JANS) are provided for each encapsulated device type as specified in MIL-PRF-19500, and two levels of product assurance (JANHC and JANKC) for each unencapsulated device type die.

    General Product Information - (Show below) - (Hide below)

    Development Note Supersedes MIL S 19500/356 (D) (02/2000)
    Document Type Standard
    Publisher US Military Specs/Standards/Handbooks
    Status Superseded
    Superseded By
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    MIL-PRF-19500 Revision P:2010 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
    MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
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