• MIL-PRF-19500-411 Revision T:2016

    Current The latest, up-to-date edition.

    Semiconductor Device, Diode, Silicon, Power Rectifier, Fast Recovery, Encapsulated (Through-Hole and Surface Mount Packages), and Un-Encapsulated, Device Types 1N5415 Through 1N5420, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC and JANKC

    Available format(s):  PDF

    Language(s):  English

    Published date:  19-09-2016

    Publisher:  US Military Specs/Standards/Handbooks

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    Table of Contents - (Show below) - (Hide below)

    1. SCOPE
    2. APPLICABLE DOCUMENTS
    3. REQUIREMENTS
    4. VERIFICATION
    5. PACKAGING
    6. NOTES

    Abstract - (Show below) - (Hide below)

    Describes the performance requirements for silicon rectifier diodes.

    Scope - (Show below) - (Hide below)

    This specification covers the performance requirements for fast recovery silicon rectifier diodes. Four levels of product assurance (JAN, JANTX, JANTXV and JANS) are provided for each encapsulated device. Two levels of product assurance (JANHC and JANKC) are provided for each un encapsulated device type. Provision for radiation hardness assurance (RHA) to four radiation (\"M\", \"D\", \"R\", and \"H\") test levels is provided for JANTXV and JANS product assurance levels.

    General Product Information - (Show below) - (Hide below)

    Development Note Supersedes MIL S 19500/411 (02/2000)
    Document Type Standard
    Publisher US Military Specs/Standards/Handbooks
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    MIL-PRF-19500 Revision P:2010 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
    MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
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