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  • MIL S 19500/435 : D

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    SEMICONDUCTOR DEVICE, DIODE, SILICON, LOW-NOISE VOLTAGE REGULATOR TYPES 1N4099-1, 1N4099C-1, 1N4099D-1 THROUGH 1N4135-1, 1N4135C-1, 1N4135D-1, 1N4614-1, 1N4614C-1, 1N4614D-1 THROUGH 1N4627-1, 1N4627C-1, 1N4627D-1, 1N4099UR-1,1N4099CUR-1, 1N4099DUR-1 THROUGH 1N4135UR-1, 1N4135CUR-1, 1N4135DUR-1, 1N4614UR-1, 1N4614CUR-1, 1N4614DUR-1 THRU 1N4627UR-1, 1N4627CUR-1

    Available format(s):  PDF

    Superseded date:  26-01-2000

    Language(s):  English

    Published date: 

    Publisher:  US Military Specs/Standards/Handbooks

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    Abstract - (Show below) - (Hide below)

    Specifies 500 milliwatt, silicon, low-noise voltage regulator diodes with voltage tolerances of 5%, 2% and 1%. 4 levels of product assurance are provided for each encapsulated device type and two levels for each unencapsulated device type.

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    Committee FSC 5961
    Document Type Standard
    Publisher US Military Specs/Standards/Handbooks
    Status Superseded
    Superseded By

    Standards Referencing This Book - (Show below) - (Hide below)

    MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
    MIL S 19500 : J SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
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