• MIL S 19500/495 : A (3)

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    SEMICONDUCTOR DEVICE, UNITIZED, DUAL-TRANSISTOR, NPN, SILICON TYPES 2N5793, TX2N5793, TXV2N5793, 2N5794, TX2N5794, TXV2N5794

    Available format(s): 

    Superseded date:  06-03-1998

    Language(s): 

    Published date:  12-01-2013

    Publisher:  US Military Specs/Standards/Handbooks

    Sorry this product is not available in your region.

    Add To Cart

    Abstract - (Show below) - (Hide below)

    Specifies two electrically isolated, unmatched NPN silicon transistors as one dual unit for hi-speed, saturated switching applications. "TX" used on devices which have passed special processing conditioning, screening and testing. "TXV" used on devices passing internal visual inspection.

    General Product Information - (Show below) - (Hide below)

    Committee FSC 5961
    Document Type Standard
    Publisher US Military Specs/Standards/Handbooks
    Status Superseded
    Superseded By

    Standards Referencing This Book - (Show below) - (Hide below)

    MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
    MIL S 19500 : J SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
    • Access your standards online with a subscription

      Features

      • Simple online access to standards, technical information and regulations
      • Critical updates of standards and customisable alerts and notifications
      • Multi - user online standards collection: secure, flexibile and cost effective