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HIGH RELIABILITY SPACE APPLICATION TEST METHODS FOR SEMICONDUCTOR DEVICES - PART 5: TEST METHODS 5000 THROUGH 5999
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Available format(s): PDF
Superseded date: 17-05-2021
Language(s): English
Published date:
Publisher: US Military Specs/Standards/Handbooks
FOREWORD1. SCOPE2. APPLICABLE DOCUMENTS3. DEFINITIONS4. GENERAL REQUIREMENTS5. DETAILED REQUIREMENTS6. NOTES
Ascertains uniform test methods for the basic high reliability space application testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations.
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