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  • SAE AS 6171/4 : 2016

    Current The latest, up-to-date edition.

    TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DELID/DECAPSULATION PHYSICAL ANALYSIS TEST METHODS

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  30-10-2016

    Publisher:  SAE International

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    Table of Contents - (Show below) - (Hide below)

    1. SCOPE
    2. REFERENCES
    3. DESCRIPTION OF THE METHODOLOGY/PROCEDURE - MICROCIRCUITS,
       HYBRIDS, DIODES, AND TRANSISTORS
    4. DESCRIPTION OF THE PROCEDURE - RESISTORS, CAPACITORS,
       INDUCTORS, FILTERS, CONNECTORS, CABLES, FUSES, TRANSFORMERS
       (PASSIVE DEVICES)
    5. TEST EQUIPMENT, TEST SAMPLES, AND CALIBRATION
    6. DETAILED REQUIREMENTS
    7. ALTERNATE PACKAGE/MATERIAL TYPES
    8. NOTES
    APPENDIX A - DECAPSULATION AND PHOTO-DOCUMENTATION EXAMPLES
    APPENDIX B - VISUAL ANOMALY EXAMPLES
    APPENDIX C - UNACCEPTABLE DECAPSULATION RESULTS
    APPENDIX D - PROFICIENCY SAMPLE QUESTIONS (FOR INTERNAL USE ONLY)

    Abstract - (Show below) - (Hide below)

    Regulates inspection, test procedures and minimum training and certification requirements to detect Suspect/Counterfeit (SC) Electrical, Electronic, and Electromechanical (EEE) components or parts utilizing Delid/Decapsulation Physical Analysis.

    General Product Information - (Show below) - (Hide below)

    Committee G-19A
    Document Type Test Method
    Publisher SAE International
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    18/30373170 DC : 0 BS EN 62668-2 - PROCESS MANAGEMENT FOR AVIONICS - COUNTERFEIT PREVENTION - PART 2: MANAGING ELECTRONIC COMPONENTS FROM NON-FRANCHISED SOURCES
    SAE AS 6171/11 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DESIGN RECOVERY TEST METHODS
    IEC TS 62668-2:2016 Process management for avionics - Counterfeit prevention - Part 2: Managing electronic components from non-franchised sources
    SAE AS 6171 : 2016 TEST METHODS STANDARD; GENERAL REQUIREMENTS, SUSPECT/COUNTERFEIT, ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS
    PD IEC/TS 62668-2:2016 Process management for avionics. Counterfeit prevention Managing electronic components from non-franchised sources

    Standards Referencing This Book - (Show below) - (Hide below)

    SAE AS 6171 : 2016 TEST METHODS STANDARD; GENERAL REQUIREMENTS, SUSPECT/COUNTERFEIT, ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS
    MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
    MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
    SAE AS 6171/5 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY RADIOLOGICAL TEST METHODS
    MIL-STD-1580 Revision B:2003 DESTRUCTIVE PHYSICAL ANALYSIS FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL PARTS
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