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    IEC 62373-1:2020

    Semiconductor devices – Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) – Part 1: Fast BTI test for MOSFET

    International Electrotechnical Committee

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    IEC 60747-9:2019

    Semiconductor devices – Part 9: Discrete devices – Insulated-gate bipolar transistors (IGBTs)

    International Electrotechnical Committee

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    IEC 60747-7:2010+AMD1:2019

    Semiconductor devices - Discrete devices - Part 7: Bipolar transistors

    International Electrotechnical Committee

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    IEC 60747-4 : 2.1

    SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 4: MICROWAVE DIODES AND TRANSISTORS

    International Electrotechnical Committee

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    IEC 60747-7:2010/AMD1:2019

    Amendment 1 - Semiconductor devices - Discrete devices - Part 7: Bipolar transistors

    International Electrotechnical Committee

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    IEC 60747-8 : 3.0

    SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 8: FIELD-EFFECT TRANSISTORS

    International Electrotechnical Committee

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    I.S. 553:1982

    SINGLE GATE FIELD-EFFECT TRANSISTORS (BLANK DETAIL SPECIFICATION)

    National Standards Authority of Ireland

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    I.S. 545:1982

    AMBIENT-RATED BIPOLAR TRANSISTORS FOR LOW AND HIGH FREQUENCY AMPLIFICATION (BLANK DETAIL SPECIFICATION)

    National Standards Authority of Ireland

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    I.S. 547:1982

    BIPOLAR TRANSISTORS FOR SWITCHING APPLICATIONS (BLANK DETAIL SPECIFICATION)

    National Standards Authority of Ireland

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    I.S. 546:1982

    CASE-RATED BIPOLAR TRANSISTORS FOR LOW FREQUENCY AMPLIFICATION (BLANK DETAIL SPECIFICATION)

    National Standards Authority of Ireland

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