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    • Semiconductor devices in general
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    I.S. EN IEC 60747-5-5:2020

    Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (IEC 60747-5-5:2020)

    National Standards Authority of Ireland

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    I.S. EN IEC 60749-17:2019

    Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (IEC 60749-17:2019)

    National Standards Authority of Ireland

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    I.S. EN IEC 60749-13:2018

    SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE

    National Standards Authority of Ireland

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    I.S. EN IEC 60191-1:2018

    MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES - PART 1: GENERAL RULES FOR THE PREPARATION OF OUTLINE DRAWINGS OF DISCRETE DEVICES

    National Standards Authority of Ireland

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    I.S. EN IEC 60749-26:2018

    SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 26: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING HUMAN BODY MODEL (HBM)

    National Standards Authority of Ireland

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    I.S. EN IEC 60749-12:2018

    SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 12: VIBRATION, VARIABLE FREQUENCY

    National Standards Authority of Ireland

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    I.S. EN 60749-28:2017

    SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 28: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - CHARGED DEVICE MODEL (CDM) - DEVICE LEVEL

    National Standards Authority of Ireland

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    I.S. EN 60749-4:2017

    SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 4: DAMP HEAT, STEADY STATE, HIGHLY ACCELERATED STRESS TEST (HAST)

    National Standards Authority of Ireland

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    I.S. EN 60749-9:2017

    SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 9: PERMANENCE OF MARKING

    National Standards Authority of Ireland

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    I.S. EN 60749-3:2017

    SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 3: EXTERNAL VISUAL EXAMINATION

    National Standards Authority of Ireland

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