Comment Closes On
|
|
Committee
|
EPL/47 |
Document Type
|
Draft |
ISBN
|
|
Pages
|
|
Published
|
|
Publisher
|
British Standards Institution
|
Status
|
Superseded |
Superseded By
|
|
IEC 60068-2-20:2008
|
Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
IEC 60749-35:2006
|
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components |
IEC 60749-3:2017
|
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination |
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