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Superseded

Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

BS EN 61747-10-1 - LIQUID CRYSTAL DISPLAY DEVICES - PART 10-1: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - MECHANICAL

Available format(s): Hardcopy, PDF

Superseded date: 31-10-2013

Language(s): English

Published date:

Table of Contents - (Show below) - (Hide below)

FOREWORD
1 Scope and object
2 Normative references
3 Terms, definitions and letter symbols
4 Test methods
BIBLIOGRAPHY

BS EN 61747-10-1

Comment Closes On
Committee	EPL/47
Document Type	Draft
ISBN
Pages
Published
Publisher	British Standards Institution
Status	Superseded
Superseded By	BS EN 61747-10-1:2013

IEC 60068-1:2013	Environmental testing - Part 1: General and guidance
IEC 60068-2-27:2008	Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
IEC 60068-2-20:2008	Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
IEC 60068-2-21:2006	Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
IEC 60747-5:1992	Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices
IEC 60747-1:2006+AMD1:2010 CSV	Semiconductor devices - Part 1: General
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV	Semiconductor devices - Mechanical and climatic test methods
IEC 60748-1:2002	Semiconductor devices - Integrated circuits - Part 1: General
IEC 61747-5-3:2009	Liquid crystal display devices - Part 5-3: Environmental, endurance and mechanical test methods - Glass strength and reliability

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FOREWORD
1 Scope and object
2 Normative references
3 Terms, definitions and letter symbols
4 Test methods
BIBLIOGRAPHY

BS EN 61747-10-1

Comment Closes On
Committee	EPL/47
Document Type	Draft
ISBN
Pages
Published
Publisher	British Standards Institution
Status	Superseded
Superseded By	BS EN 61747-10-1:2013

IEC 60068-1:2013	Environmental testing - Part 1: General and guidance
IEC 60068-2-27:2008	Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
IEC 60068-2-20:2008	Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
IEC 60068-2-21:2006	Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
IEC 60747-5:1992	Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices
IEC 60747-1:2006+AMD1:2010 CSV	Semiconductor devices - Part 1: General
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV	Semiconductor devices - Mechanical and climatic test methods
IEC 60748-1:2002	Semiconductor devices - Integrated circuits - Part 1: General
IEC 61747-5-3:2009	Liquid crystal display devices - Part 5-3: Environmental, endurance and mechanical test methods - Glass strength and reliability