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  • 15/30317578 DC : 0

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    BS ISO 16700 - MICROBEAM ANALYSIS - SCANNING ELECTRON MICROSCOPY - GUIDELINES FOR CALIBRATING IMAGE MAGNIFICATION

    Available format(s):  Hardcopy, PDF

    Superseded date:  31-07-2016

    Language(s):  English

    Published date: 

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Foreword
    Introduction
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Image magnification
    5 Reference material
    6 Calibration procedures
    7 Accuracy of image magnification and scale marker
    8 Calibration report
    Annex A (informative) - Reference materials for magnification
    Annex B (informative) - Parameters that influence the
            resultant magnification of an SEM
    Annex C (informative) - Uncertainties in magnification
            measurements
    Annex D (informative) - Example of a test report
    Bibliography

    General Product Information - (Show below) - (Hide below)

    Comment Closes On
    Committee CII/9
    Document Type Draft
    Publisher British Standards Institution
    Status Superseded
    Superseded By

    Standards Referencing This Book - (Show below) - (Hide below)

    ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
    ISO 5725-1:1994 Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions
    ISO Guide 35:2017 Reference materials Guidance for characterization and assessment of homogeneity and stability
    ISO Guide 30:2015 Reference materials Selected terms and definitions
    ISO Guide 34:2009 General requirements for the competence of reference material producers
    ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)
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