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    NA Status of Standard is Unknown

    BS EN 62668-2 - PROCESS MANAGEMENT FOR AVIONICS - COUNTERFEIT PREVENTION - PART 2: MANAGING ELECTRONIC COMPONENTS FROM NON-FRANCHISED SOURCES

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date: 

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms, definitions and abbreviated terms
    4 Technical requirements
    Annex A (informative) - Flowchart of IEC 62668-1 requirements
    Annex B (informative) - Example of detailed tests list, linked
            with risks levels
    Annex C (informative) - iNEMI assessment methodology and
            metric development
    Annex D (informative) - Summary of SAE AS6171 series
            proposed test methods under consideration by
            SAE International Techniques for Suspect/Counterfeit
            EEE Assembly Detection by Various Test Methods
    Bibliography

    General Product Information - (Show below) - (Hide below)

    Comment Closes On
    Committee GEL/107
    Document Type Draft
    Publisher British Standards Institution
    Status NA

    Standards Referencing This Book - (Show below) - (Hide below)

    SAE AS 5553B : 2016 COUNTERFEIT ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL (EEE) PARTS; AVOIDANCE, DETECTION, MITIGATION, AND DISPOSITION
    ISO 16678:2014 Guidelines for interoperable object identification and related authentication systems to deter counterfeiting and illicit trade
    SAE AS 6174 : 2014 COUNTERFEIT MATERIEL - ASSURING ACQUISITION OF AUTHENTIC AND CONFORMING MATERIEL
    SAE AS 6171/1 : 2016 SUSPECT/COUNTERFEIT TEST EVALUATION METHOD
    SAE AS 6171 : 2016 TEST METHODS STANDARD; GENERAL REQUIREMENTS, SUSPECT/COUNTERFEIT, ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS
    MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
    SAE AS 6171/6 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY ACOUSTIC MICROSCOPY (AM) TEST METHODS
    MIL-PRF-55681 Revision G:2016 CAPACITOR, CHIP, MULTIPLE LAYER, FIXED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
    SAE AS 6081 : 2012 FRAUDULENT/COUNTERFEIT ELECTRONIC PARTS: AVOIDANCE, DETECTION, MITIGATION, AND DISPOSITION - DISTRIBUTORS
    SAE AS 6171/11 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DESIGN RECOVERY TEST METHODS
    SAE AS 6171/7 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY ELECTRICAL TEST METHODS
    MIL-PRF-19500 Revision P:2010 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
    IEC/ISO 31010:2009 Risk management - Risk assessment techniques
    ISO 31000:2009 Risk management Principles and guidelines
    IEC TS 62668-1:2016 Process management for avionics - Counterfeit prevention - Part 1: Avoiding the use of counterfeit, fraudulent and recycled electronic components
    SEMI T20.2 : 2009(R2016) GUIDE FOR QUALIFICATIONS OF AUTHENTICATION SERVICE BODIES FOR DETECTING AND PREVENTING COUNTERFEITING OF SEMICONDUCTORS AND RELATED PRODUCTS
    MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
    MIL-STD-202-107 Base Document:2015 METHOD 107, THERMAL SHOCK
    MIL-STD-202-106 Base Document:2015 METHOD 106, MOISTURE RESISTANCE
    MIL-PRF-39014 Revision J:2016 Capacitor, Fixed, Ceramic Dielectric (General Purpose), Established Reliability and Non-Established Reliability, General Specification for
    IEC TS 62239-1:2015 Process management for avionics - Management plan - Part 1: Preparation and maintenance of an electronic components management plan
    SAE AS 6171/8 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY RAMAN SPECTROSCOPY TEST METHODS
    SAE AS 6171/3 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY X-RAY FLUORESCENCE TEST METHODS
    SAE AS 6171/4 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DELID/DECAPSULATION PHYSICAL ANALYSIS TEST METHODS
    IEC 62402:2007 Obsolescence management - Application guide
    GEIA STD 0016 : 2012 PREPARING A DMSMS MANAGEMENT PLAN
    ISO 14001:2015 Environmental management systems — Requirements with guidance for use
    IEC TS 62686-1:2015 Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
    SAE ARP 6178 : 2011 FRAUDULENT/COUNTERFEIT ELECTRONIC PARTS - TOOL FOR RISK ASSESSMENT OF DISTRIBUTORS
    SAE AS 6171/9 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY FOURIER TRANSFORM INFRARED SPECTROSCOPY (FTIR) TEST METHODS
    MIL-PRF-39003 Revision N:2016 Capacitor, Fixed, Electrolytic (Solid Electrolyte), Tantalum, Established Reliability, General Specification for
    ISO 9001:2015 Quality management systems — Requirements
    MIL-STD-202-108 Base Document:2015 METHOD 108, LIFE (AT ELEVATED AMBIENT TEMPERATURE)
    SAE AS 6171/5 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY RADIOLOGICAL TEST METHODS
    MIL-STD-1580 Revision B:2003 DESTRUCTIVE PHYSICAL ANALYSIS FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL PARTS
    ISO 28000:2007 Specification for security management systems for the supply chain
    IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    IEC 60115-8:2009 Fixed resistors for use in electronic equipment - Part 8: Sectional specification - Fixed surface mount resistors
    SEMI T20 : 2010(R2016) SPECIFICATION FOR AUTHENTICATION OF SEMICONDUCTORS AND RELATED PRODUCTS
    ISO Guide 73:2009 Risk management — Vocabulary
    IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
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