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  • BS CECC 43000(1982) : AMD 7315

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: DIRECTLY HEATED NEGATIVE TEMPERATURE COEFFICIENT THERMISTORS

    Available format(s): 

    Superseded date:  23-07-2013

    Language(s): 

    Published date:  23-11-2012

    Publisher:  British Standards Institution

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    Abstract - (Show below) - (Hide below)

    Describes terms and methods of test applicable to directly heated thermistors, insulated and non-insulated types with negative temperature coefficients (NTC-D). BS AMD 7315 RENUMBERS THIS STANDARD TO BS EN 143000

    General Product Information - (Show below) - (Hide below)

    Committee ECL/4
    Development Note Superseded and renumbered by BS EN 143000 (07/2004)
    Document Type Standard
    Publisher British Standards Institution
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS EN 143004:1992 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (rod type)
    BS EN 143001:1992 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (beads in solid glass or vitreous enamel)
    BS EN 143003:1992 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (disc type)
    BS EN 143002:1992 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (beads in envelopes)

    Standards Referencing This Book - (Show below) - (Hide below)

    CECC 00109 : 1974 CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS
    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
    IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
    IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
    CECC 00100 : 1988 BASIC RULES - TO BE USED IN CONNECTION WITH THE INTERNAL REGULATIONS OF THE FEN e.V
    IEC 60068-2-11:1981 Basic environmental testing procedures - Part 2-11: Tests - Test Ka: Salt mist
    ISO 3:1973 Preferred numbers Series of preferred numbers
    IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
    IEC 60294:2012 Measurement of the dimensions of a cylindrical component with axial terminations
    CECC 00107(PT1) : 1982 CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - QUALITY ASSESSMENT PROCEDURE FOR GENERAL USAGE
    IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
    IEC 60062:2016 Marking codes for resistors and capacitors
    CECC 00111 : 80 AMD 3 CECC RULES OF PROCEDURE: RP 11: SPECIFICATIONS AND THEIR HARMONIZATION - COMPONENTS FOR GENERAL AND PROFESSIONAL USAGE - COMPONENTS OF ENHANCED ASSESSMENT OF QUALITY
    IEC 60063:2015 Preferred number series for resistors and capacitors
    IEC 60068-2-29:1987 Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
    IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    CECC 00007 : 1978 BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES
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