• BS CECC68000(1990) : AMD 9184

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: QUARTZ CRYSTAL UNITS

    Available format(s): 

    Superseded date:  15-12-1996

    Language(s): 

    Published date:  23-11-2012

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Foreword
    Preface
    Section 1 - Scope
    Section 2 - General
    2.1 Order of precedence
    2.2 Related documents
    2.3 Units, symbols and terminology
    2.4 Preferred ratings and characteristics
    2.5 Marking
    Section 3 - Quality assessment procedures
    3.1 Primary stage of manufacture
    3.2 Structurally similar components
    3.3 Subcontracting
    3.4 Manufacturer's approval
    3.5 Approval procedures
    3.6 Procedures for capability approval
    3.7 Procedures for qualification approval
    3.8 Test procedures
    3.9 Screeing requirements
    3.10 Rework and repair work
    3.11 Certified test records
    3.12 Delayed delivery
    3.13 Release for delivery
    3.14 Unchecked parameters
    Section 4 - Test and measurement procedures
    4.1 General
    4.2 Alternative methods
    4.3 Precision of measurement
    4.4 Standard conditions for testing
    4.5 Visual inspection
    4.6 Dimensioning and gauging procedures
    4.7 Electrical test procedures
    4.7.1 Frequency and resonance resistance
    4.7.2 Drive level dependency
    4.7.3 Frequency and resonance resistance as a function
           of temperature
    4.7.4 Unwanted responses
    4.7.5 Shunt capacitance
    4.7.6 Load resonance frequency and resistance
    4.7.7 Frequency pulling range
    4.7.8 Motional parameters
    4.7.9 Insulation resistance
    4.8 Mechanical and environmental test procedures
    4.8.1 Robustness of terminations
    4.8.2 Sealing tests
    4.8.3 Soldering (Solderability and resistance to solder
           heat)
    4.8.4 Rapid change of temperature, two-fluid-bath method
    4.8.5 Rapid change of temperature with prescribed time
           of transition
    4.8.6 Bump
    4.8.7 Vibration
    4.8.8 Shock
    4.8.9 Free fall
    4.8.10 Acceleration, steady state
    4.8.11 Dry heat
    4.8.12 Damp heat, cyclic
    4.8.13 Cold
    4.8.14 Climatic sequence
    4.8.15 Damp heat steady state
    4.8.16 Immersion in cleaning solvents
    4.9 Endurance test procedure
    4.9.1 Ageing
    4.9.2 Extended ageing
    4.9.3 Shelf life
    Annex A. Drive level dependency

    Abstract - (Show below) - (Hide below)

    Describes methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.AMD 9184 RENUMBERS THIS STANDARD

    General Product Information - (Show below) - (Hide below)

    Committee ECL/11
    Development Note Superseded and renumbered by BS EN 168000 (07/2004)
    Document Type Standard
    Publisher British Standards Institution
    Status Superseded
    Superseded By
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS EN 168100:1995 Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval)
    BS EN 168101:1997 Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval)

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
    IEC 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
    IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
    IEC 60444-2:1980 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
    IEC 60068-2-11:1981 Basic environmental testing procedures - Part 2-11: Tests - Test Ka: Salt mist
    IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
    IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
    IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
    IEC 60027-2:2005 Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics
    IEC 60068-2-29:1987 Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
    IEC 60302:1969 Standard definitions and methods of measurement for piezoelectric vibrators operating over the frequency range up to 30 MHz
    IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
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