CECC 00114-3 : 94 AMD 2
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CAPABILITY APPROVAL OF AN ELECTRONIC COMPONENT MANUFACTURING ACTIVITY |
CECC 00109 : 1974
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CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS |
HD 323.2.20 : 200S3
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BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING |
IEC 60068-1:2013
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Environmental testing - Part 1: General and guidance |
CECC 00111 PT3 : 1991 AMD 4
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CENELEC ELECTRONIC COMPONENTS COMMITTEE - RULE OF PROCEDURE 11 - SPECIFICATIONS - PART 3: REGULATIONS CECC SPECIFICATIONS FOR COMPONENTS GENERAL AND PROFESSIONAL (CIVIL AND MILITARY) USAGE (EXCLUDING DETAIL SPECIFICATIONS) |
IEC 60068-2-58:2015+AMD1:2017 CSV
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Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD) |
IEC 60068-2-27:2008
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Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
HD 323.2.13 : 200S1
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BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST M: LOW AIR PRESSURE |
IEC 60068-2-20:2008
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Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
EN 60068-2-1:2007
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Environmental testing - Part 2-1: Tests - Test A: Cold |
EN 60068-2-2:2007
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Environmental testing - Part 2-2: Tests - Test B: Dry heat |
IEC 60068-2-21:2006
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Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
IEC 60068-2-13:1983
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Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure |
EN 60068-1:2014
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Environmental testing - Part 1: General and guidance |
HD 323.2.14 : 200S2
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BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE |
EN 60068-2-7:1993
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Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state |
IEC 60027-1:1992
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Letters symbols to be used in electrical technology - Part 1: General |
HD 323.2.30 : 200S3
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BASIC ENVIRONMENTAL TESTING PROCEDURES - PART 2: TESTS - TEST DB AND GUIDANCE: DAMP HEAT, CYCLIC (12 + 12-HOUR CYCLE) |
EN 60068-2-27:2009
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Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
HD 323.2.3 : 200S2
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BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE |
IEC 60068-2-3:1969
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Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
EN 100114-1 : 1996
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RULE OF PROCEDURE - QUALITY ASSESSMENT PROCEDURES - PART 1: CECC REQUIREMENTS FOR THE APPROVAL OF AN ORGANIZATION |
CECC 00114-2 : 1994
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RULE OF PROCEDURE 14 - QUALITY ASSESSMENT PROCEDURES - PART 2: QUALIFICATION APPROVAL OF ELECTRONIC COMPONENTS |
EN 60068-2-21:2006
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Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
IEC 60068-2-2:2007
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Environmental testing - Part 2-2: Tests - Test B: Dry heat |
IEC 60068-2-2a:1976
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Supplement A - Basic environmental testing procedures - Part 2: Tests - Tests B: Dry heat |
EN 60068-2-29:1993
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Environmental testing - Part 2: Tests - Test Eb and guidance: Bump |
EN 60068-2-6:2008
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Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal) |
IEC 60068-2-29:1987
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Environmental testing. Part 2: Tests. Test Eb and guidance: Bump |
IEC 60068-2-1:2007
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Environmental testing - Part 2-1: Tests - Test A: Cold |
HD 323.2.58 : 200S1
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TEST TD: SOLDERABILITY, RESISTANCE TO DISSOLUTION OF METALIZATION AND TO SOLDERING HEAT OF SURFACE MOUNTING DEVICES (SMD) |
IEC 60068-2-14:2009
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Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
IEC 61338-1-3:1999
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Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency |
IEC 60068-2-30:2005
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Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |