BS IEC 60747-10:1991

1 Scope
2 General
3 Quality assessment procedures
4 Test and measurement procedures
Appendix A - Lot tolerance per cent defective
         (LTPD) sampling plans
Appendix B - Dimensions to be checked
Appendix C - Directions for applied forces for
         mechanical tests
Appendix D - (informative) - Assessment of quality
         levels in ppm (parts per million)
Publication(s) referred to

General procedures for quality assessment to be used in the IECQ system and general rules for measurement methods of electrical characteristics, climatic and mechanical tests and endurance tests.

This publication forms part of the IEC Quality Assessment System for Electronic Components (IECQ).

This publication is a generic specification for semiconductor devices: discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits.

It defines general procedures for quality assessment to be used in the IECQ System and gives general rules for:

• measurement methods of electrical characteristics;

• climatic and mechanical tests;

• endurance tests.

NOTE This publication must be supplemented by the approved sectional, family and blank detail specifications, where they exist, appropriate to the specific individual type or types.