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  • BS IEC 60747-14.1 : 2010

    Current The latest, up-to-date edition.

    SEMICONDUCTOR DEVICES - PART 14-1: SEMICONDUCTOR SENSORS - GENERIC SPECIFICATION FOR SENSORS

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-2010

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 Terminology, units, letter symbols, terms and
      definitions
    4 Standard environmental conditions
    5 Marking
    6 Quality assessment procedures
    7 Test and measurement procedures
    Annex A (normative) - Sampling procedures
    Bibliography

    Abstract - (Show below) - (Hide below)

    Provides general items concerning the specifications for sensors, which are the basis for specifications given in other parts of this series for various types of sensors.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47
    Development Note Supersedes 98/232612 DC. (05/2005) Supersedes 08/30181401 DC. (05/2010)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 61193-2:2007 Quality assessment systems - Part 2: Selection and use of sampling plans for inspection of electronic components and packages
    IECQ 001002-3:2005 IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    IEC 60721-2-1:2013 Classification of environmental conditions - Part 2-1: Environmental conditions appearing in nature - Temperature and humidity
    IEC 62047-1:2016 Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions
    IEC 60721-3-0:1984+AMD1:1987 CSV Classification of environmental conditions - Part 3: Classification of groups of environmental parameters and their severities - Introduction
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60721-3-1:1997 Classification of environmental conditions - Part 3 Classification of groups of environmental parameters and their severities - Section 1: Storage
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