BS ISO 15932:2013

Foreword
Introduction
0 Scope
1 Abbreviated terms
2 Definitions of terms used in the physical basis
  of AEM
3 Definitions of terms used in AEM instrumentation
4 Definitions of terms used in specimen preparation
  of AEM
5 Definitions of terms used in AEM image formation
  and processing
6 Definitions of terms used in AEM image
  interpretation and analysis
7 Definitions of terms used in the measurement and
  calibration of AEM image magnification
  and resolution
8 Definitions of terms used in electron diffraction
  in AEM
Bibliography

Describes terms used in the practice of AEM. It includes both general and specific concepts classified according to their hierarchy in a systematic order.

This International Standard defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. This International Standard is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them. NOTE See also the ISO online browsing platform (OBP): https://www.iso.org/obp/ui/