• PD CLC/TR 62258-3:2007

    Current The latest, up-to-date edition.

    Semiconductor die products Recommendations for good practice in handling, packing and storage

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  31-05-2008

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    INTRODUCTION
    1 Scope and object
    2 Normative references
    3 Terms and definitions
    4 Handling - Good practice
       4.1 General
       4.2 Working environmental controls
       4.3 General handling precautions
       4.4 Cleanroom good practice
    5 Process handling issues
       5.1 Wafer sawing
       5.2 Die sorting
    6 Die and wafer transport and storage media
       6.1 Wafer carriers and cassettes
       6.2 In-process carriers and transport systems
       6.3 Packing for shipment of unsawn wafers
       6.4 Packing for shipment of sawn wafers
       6.5 Packing for shipment of single wafers
       6.6 Packing for shipment of die using trays
       6.7 Packing for shipment of die using tape-and-reel
       6.8 Secondary packing for shipment
    7 Storage good practice
       7.1 Die and wafer storage
       7.2 Short-term storage environment and conditions
       7.3 Storage time limitations
       7.4 Sawn wafer on wafer frame or ring
       7.5 Die products in the production area
       7.6 Die in tape-and-reel
       7.7 Dry-packed die products
    8 Traceability good practice
       8.1 General
       8.2 Wafer traceability
       8.3 Die products traceability
       8.4 Wafer and die back side marking
    9 Guidelines for long-term storage (die banking) of bare die
       and wafers
       9.1 General
       9.2 Preparing for storage
       9.3 Damage to die products during long-term storage
       9.4 Long-term storage environment
       9.5 Recommended inert atmosphere purity
       9.6 Chemical contamination
       9.7 Electrical effects
       9.8 Protection from radiation
       9.9 Periodic qualification of stored die products
    10 Good practice for automated handling during assembly
       10.1 Removal of die from shipping media
       10.2 Equipment out of service
    Annex A (informative) - Planning checklist
    Annex B (informative) - Material specifications
    Annex ZA (normative) - Normative references to international
                          publications with their corresponding
                          European publications
    Bibliography

    Abstract - (Show below) - (Hide below)

    Facilitates the production, supply and use of semiconductor die products, including: - wafers, - singulated bare die, - die and wafers with attached connection structures, and - minimally or partially encapsulated die and wafers.

    Scope - (Show below) - (Hide below)

    IEC 60855-1:2016 is applicable to insulating foam-filled tubes and solid rods, of a circular cross-section, made of synthetic materials with reinforced fibreglass and intended to be used in the manufacture and construction of tools, devices and equipment for carrying out live working on electrical systems operating at voltages above 1 kV. This second edition cancels and replaces the first edition published in 2009. This edition constitutes a technical revision.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47
    Development Note 2007 version incorporates Corrigendum 2008 to BS PD IEC TR 62258-3 and renumbers and supersedes BS PD IEC TR 62258-3. Supersedes BS PD ES 59008-4.2 & 04/30110525 DC. (05/2008)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    EN 61340-5-1:2016/AC:2017-05 ELECTROSTATICS - PART 5-1: PROTECTION OF ELECTRONIC DEVICES FROM ELECTROSTATIC PHENOMENA - GENERAL REQUIREMENTS (IEC 61340-5-1:2016/COR1:2017)
    IEC TS 61340-5-2:1999 Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide
    IEC 62258-1:2009 Semiconductor die products - Part 1: Procurement and use
    EN 62258-1:2010 Semiconductor die products - Part 1: Procurement and use
    EN 60286-3:2013/AC:2013 PACKAGING OF COMPONENTS FOR AUTOMATIC HANDLING - PART 3: PACKAGING OF SURFACE MOUNT COMPONENTS ON CONTINUOUS TAPES (IEC 60286-3:2013)
    IEC 62258-2:2011 Semiconductor die products - Part 2: Exchange data formats
    ISO 14644-1:2015 Cleanrooms and associated controlled environments Part 1: Classification of air cleanliness by particle concentration
    EN 61340-5-2:2001/corrigendum:2001 ELECTROSTATICS - PART 5-2: PROTECTION OF ELECTRONIC DEVICES FROM ELECTROSTATIC PHENOMENA - USER GUIDE
    IEC 60286-3:2013 Packaging of components for automatic handling - Part 3: Packaging of surface mount components on continuous tapes
    EN ISO 14644-1:2015 Cleanrooms and associated controlled environments - Part 1: Classification of air cleanliness by particle concentration (ISO 14644-1:2015)
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