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  • CECC 00200 : 2002

    Current The latest, up-to-date edition.

    REGISTER OF FIRMS, PRODUCTS AND SERVICES APPROVED UNDER CECC CERTIFICATION SYSTEM FOR ELECTRONIC COMPONENTS

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    Published date:  12-01-2013

    Publisher:  Cenelec Electronic Components Committee

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    Document Type Standard
    Publisher Cenelec Electronic Components Committee
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS CECC 20005(1986) : 1986 AMD 8004 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION. PHOTODIODES, PHOTODIODE ARRAYS (NOT INTENDED FOR FIBRE OPTIC APPLICATIONS)
    BS CECC 31401:1988 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed ceramic dielectric capacitors, dielectric class 1, for electrical shock hazard protection
    BS CECC 90203:1985 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated analogue switching circuits
    BS CECC 265001:1998 Harmonized system of quality assessment for electronic components. Technology approval schedule. Film and hybrid integrated circuits
    CEI CECC 32101-804 : 2002 SPECIFICA DI DETTAGLIO: CONDENSATORI FISSI CERAMICI MULTISTRATO A MONTAGGIO SUPERFICIALE, CLASSE 1, SOTTOCLASSE 1B, TIPO CG, CATEGORIA CLIMATICA 55/125/56, LIVELLO EZ
    BS CECC 30702:1993 Specification for harmonized system for quality assessment for electronic components. Blank detail specification. Fixed capacitors of ceramic dielectric, class 2. (Assessment level P. Telecom level)
    I.S. EN 125000:1999 CORES MADE FROM FERRITE MATERIALS (GENERIC SPECIFICATION)
    BS CECC 30301 024:1981 Harmonized detail specification for fixed aluminium electrolytic capacitors (long-life grade). Non-solid electrolyte. Cylindrical, polar insulated metallic case, clamp or stud mounting screw terminations. Full plus additional assessment level
    BS EN 160200-1:1998 Harmonized system of quality assessment for electronic components. Sectional specification. Microwave modular electronic units of assessed quality Capability approval procedure
    CEI CECC 32101-805 : 2002 DETAIL SPECIFICATION: FIXED MULTILAYER CERAMIC SURFACE MOUNTING CAPACITORS, CLASS 2, SUB-CLASSES 2C1 AND 2R1, CLIMATIC CATEGORY 55/125/56, ASSESSMENT LEVEL EZ, WITH FAILURE RATE LEVELS
    DEFSTAN 59-44(PT8)SEC2/1(1981) : 1981 CAPACITORS, FIXED, OF ASSESSED QUALITY - PART 8: CAPACITORS, FIXED, ELECTROLYTIC-SOLID ELECTROLYTE, ALUMINIUM - SECTION 2: LIST OF ITEMS CONFORMING TO CECC 30302-001
    DEFSTAN 59-30(PT1)/4(1980) : 1980 AMD 1 RESISTORS, FIXED, OF ASSESSED QUALITY - PART 1: RESISTORS, FIXED, NON-WIREWOUND, INSULATED, MEDIUM STABILITY - MULTIPLE RATING FULL ASSESSMENT
    EN 125000:1997 Generic Specification: Cores made of ferrite materials
    EN 140400:2003 Sectional specification: Fixed low power surface mount (SMD) resistors
    EN 160100 : 1997 CAPABILITY APPROVAL OF MANUFACTURERS OF PRINTED BOARD ASSEMBLIES OFASSESSED QUALITY (SECTIONAL SPECIFICATION)
    EN 196500:1993/A1:2001 SECTIONAL SPECIFICATION: MEMBRANE SWITCHES INCLUDING BLANK DETAIL SPECIFICATION EN 196501
    BS CECC 90000:1991 Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
    BS CECC 90202:1990 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers
    BS EN 150009:1993 Harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes
    I.S. EN 160200-1:1998 MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - PART 1: CAPABILITY APPROVAL PROCEDURE (SECTIONAL SPECIFICATION)
    BS CECC 00114-5:1993 Rule of procedure 14. Quality assessment procedures Process approval of specialist contractors within the electronic components industry
    BS EN 190101:1994 Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits series 54, 64, 74, 84
    BS EN 150008:1993 Harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes
    DEFSTAN 59-30(PT2)/2(1978) : 1978 AMD 2 RESISTORS, FIXED, OF ASSESSED QUALITY - PART 2: RESISTORS, FIXED, NON-WIREWOUND, INSULATED, LOAD LIFE STABILITY 0.5 PER CENT MAXIMUM FULL ASSESSMENT
    BS EN 169000:1993 Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators
    BS EN 196403:2000 Harmonized systems of quality assessment for electronic components. Blank detail specification: push button switches. Assessment level Y
    BS CECC 90201:1984 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators
    BS CECC 96300:1988 Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: sensitive switches
    BS EN 160100:1998 Harmonized system of quality assessment for electronic components. Sectional specification: capability approval of manufacturers of printed board assemblies of assessed quality
    BS CECC 30401 033:1981 Harmonized detail specification for fixed metallized polyethylene terephthalate film dielectric d.c. capacitors (long-life grade). Rectangular insulated non-metallic case, rigid radial terminations. Full assessment level
    BS CECC 20003(1986) : 1986 AMD 8002 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION. PHOTOTRANSISTORS,PHOTODARLINGTON TRANSISTORS,PHOTOTRANSISTOR ARRAYS
    BS CECC 96100:1988 Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: rotary switches
    BS CECC 00111-0:1994 Rule of Procedure 11. Specifications An introduction to the types of specifications applicable within the CECC system
    DEFSTAN 59-44(PT8)SEC1/1(1981) : 1981 CAPACITORS, FIXED, OF ASSESSED QUALITY - PART 8: CAPACITORS, FIXED, ELECTROLYTIC-SOLID ELECTROLYTE, ALUMINIUM - SECTION 1: SECTIONAL REQUIREMENTS AND INDEX TO SECTIONS
    I.S. 1107:1991 LEAD SCREW ACTUATED PRESET POTENTIOMETERS - SQUARE FORMS (DETAIL SPECIFICATION)
    I.S. 1128:1991 ELECTROMECHANICAL ALL-OR NOTHING RELAYS POLARIZED MONOSTABLE HERMETICALLY SEALED GENERAL PURPOSE RELAYS (DETAIL SPECIFICATION)
    BS CECC 30801:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Tantalum surface mounting capacitors
    BS CECC 30501:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Fixed metallized polycarbonate film dielectric capacitors for direct current
    BS CECC 30800:1991 Harmonized system of quality assessment for electronic components. Sectional specification: tantalum surface mounting capacitors
    BS CECC 90201:1990 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators
    BS CECC 30202:1988 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte, porous anode (sub-family 2)
    BS CECC 30701:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Fixed capacitors of ceramic dielectric, class 2. (Assessment level E)
    BS CECC 90301:1985 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated line transmitters and receivers
    BS CECC 200025:1998 Harmonized system of quality assessment for electronic components. Process assessment schedule: printed board assembly facilities
    DEFSTAN 59-30(PT0)/2(1991) : 1991 RESISTORS OF ASSESSED QUALITY, SELECTION AND PROCUREMENT - PART 0: GENERAL GUIDANCE AND REQUIREMENTS
    BS CECC 96200:1988 Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: lever switches
    96/205775 DC : 0 BS CECC 210003 - TECHNOLOGY APPROVAL SCHEDULE FOR PRINTED BOARDS
    CEI CECC 200025 : 2000 PROCESS ASSESSMENT SCHEDULE: PRINTED BOARD ASSEMBLY FACILITIES
    BS EN 196103:2000 Blank detail specification: Rotary switches. Assessment level Y
    BS EN 196500:1993 Harmonized system of quality assessment for electronic components. Sectional specification. Membrane switches including blank detail specification EN 196501
    BS CECC 00111-7:1994 Rule of Procedure 11. Specifications Regulations for component specifications and assessment specifications
    BS EN 120000:1996 Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices
    BS CECC 90202:1985 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers
    BS EN 125000:1998 Harmonized system of quality assessment for electronic components. Generic specification: cores made of ferrite materials
    BS CECC20006(1988) : 1988 AMD 8005 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION. PIN PHOTODIODES FOR FIBRE OPTIC APPLICATIONS
    BS EN 140400:2003 Harmonized system of quality assessment for electronic components. Sectional specification. Fixed low power surface mount (SMD) resistors
    I.S. EN 160201:1998 MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - CAPABILITY APPROVAL (BLANK DETAIL SPECIFICATION)
    I.S. EN 140400:2004 SECTIONAL SPECIFICATION: FIXED LOW POWER SURFACE MOUNTING (SMD) RESISTORS
    I.S. EN 141101:1994 LEAD-SCREW ACTUATED AND ROTARY PRESET POTENTIOMETERS (BLANK DETAIL SPECIFICATION)
    EN 141101:1992 Blank Detail Specification: Lead-screw actuated and rotary preset potentiometers
    PD 3542:1991 The role of standards in company quality management
    BS CECC 00114-3:1993 Rule of procedure 14. Quality assessment procedures Capability approval of an electronic component manufacturing activity
    BS CECC 31501:1988 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed ceramic capacitors of dielectric class 2 for electrical shock hazard protection
    02/203178 DC : 0 PREN 140101-806 - DETAIL SPECIFICATION - FIXED LOW POWER NON-WIRE WOUND RESISTORS - METAL FILM RESISTORS ON HIGH GRADE CERAMIC, CONFORMAL COATED OR MOLDED, AXIAL OR PREFORMED LEADS - ASSESSMENT LEVEL Z - VERSION A: WITH 100-%-TEST - VERSION E: WITH FAILURE RATE LEVEL AND 100-%-TEST - STABILITY CLASSES 0,05; 0,1; 0,25; 0,5; 1; 2
    BS EN 150015:1993 Harmonized system of quality assessment for electronic components. Blank detail specification: unidirectional transient overvoltage suppressor diodes
    BS CECC 96400:1988 Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: push-button switches
    96/205776 DC : DRAFT MAY 1996 BS CECC 200021 - PROCESS ASSESSMENT SCHEDULE FOR MASS LAMINATION PANELS
    BS EN 190103:1994 Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY, circuits, series 54LS, 64LS, 74LS, 84LS
    BS EN 123000:1992 Harmonized system of quality assessment for electronic components. Generic specification: printed boards
    BS CECC 42201:1988 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Surge suppression varistors
    BS CECC 299001:1999 Technology approval schedule. Manufacture of electrical connectors
    DEFSTAN 59-62(PT5)/1(1983) : 1983 MICROCIRCUITS ELECTRONIC (INTEGRATED CIRCUITS) - PART 5: ANALOGUE SWITCH/MULTIPLEXERS
    DIN 45910-125:1992-04 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS; DETAIL SPECIFICATION: NON-POLAR ALUMINIUM ELECTROLYTIC CAPACITORS WITH NON-SOLID ELECTROLYTE DC 40 TO 100 V (SUITABLE TO VAC LOAD WITHOUT USING A POLARIZING POTENTIAL), GENERAL PURPOSE GRADE, CYLINDRICAL METAL CASE WITH INSULATION SLEEVE, AXIAL WIRE LEADS, CLIMATIC CATEGORY 40/085/056
    DEFSTAN 59-30(PT3)/2(1978) : 1978 RESISTORS, FIXED, OF ASSESSED QUALITY - PART 3: RESISTORS, FIXED, WIREWOUND, NON-INSULATED, POWER (2.5 TO 12 WATTS) FULL ASSESSMENT
    EN 160200-1 : 1997 MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - PART 1: CAPABILITY APPROVAL PROCEDURE (SECTIONAL SPECIFICATION)
    EN 16602-60-12:2014 Space product assurance - Design, selection, procurement and use of die form monolithic microwave integrated circuits (MMICs)
    DEFSTAN 59-30(PT4)/2(1980) : 1980 RESISTORS, FIXED, OF ASSESSED QUALITY - PART 4: RESISTORS, FIXED, NON-WIREWOUND, INSULATED, LOW POWER FULL ASSESSMENT
    CECC 200025 : 1998 PROCESS ASSESSMENT SCHEDULE: PRINTED BOARD ASSEMBLY FACILITIES
    I.S. EN 16602-60-12:2014 SPACE PRODUCT ASSURANCE - DESIGN, SELECTION, PROCUREMENT AND USE OF DIE FORM MONOLITHIC MICROWAVE INTEGRATED CIRCUITS (MMICS)
    BS EN 111101:1996 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Display storage tubes
    BS EN 114001:1997 Harmonized system of quality assessment for electronic components. Blank detail specification: photomultiplier tubes
    BS CECC 90114:1990 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: programmable logic arrays (PLA)
    BS EN 150014:1997 Harmonized system of quality assessment for electronic components. Blank detail specification: Thyristor diodes, transient overvoltage suppressors
    BS CECC 30401 023:1979 Harmonized detail specification for fixed metallized polyethylene terephthalate film dielectric d.c. capacitors. Rectangular insulated non-metallic case, rigid radial terminations. Full assessment level
    BS EN 16602-60-12:2014 Space product assurance. Design, selection, procurement and use of die form monolithic microwave integrated circuits (MMICs)
    BS EN 160201:1998 Harmonized system of quality assessment for electronic components. Blank detail specification. Microwave modular electronic units of assessed quality. Capability approval
    DEFSTAN 59-36/4(1990) : 1990 ELECTRONIC & ASSOCIATED ELECTRICAL COMPONENTS FOR DEFENCE PURPOSES - PROCEDURE FOR THE SELECTION & SPECIFICATION OF ELECTRONIC & ASSOCIATED ELECTRICAL COMPONENTS FOR USE IN DEFENCE EQUIPMENT
    BS CECC 41101-007:1985 Harmonized blank detail specification for lead screw actuated non-wirewound preset potentiometers. Square form, container sealed, actuating device insulated from resistive element, slipping clutch at each end of travel, rigid terminations. Assessment level S.
    I.S. EN 160100:1998 CAPABILITY APPROVAL OF MANUFACTURERS OF PRINTED BOARD ASSEMBLIES OFASSESSED QUALITY (SECTIONAL SPECIFICATION)
    EN 160201 : 1997 MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - CAPABILITY APPROVAL (BLANK DETAIL SPECIFICATION)
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