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  • CEI EN 60747-5-2 : 2002

    Current The latest, up-to-date edition.

    DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-2: OPTOELECTRONIC DEVICES - ESSENTIAL RATINGS AND CHARACTERISTICS

    Available format(s):  Hardcopy, PDF

    Language(s):  English - French, English

    Published date:  01-01-2002

    Publisher:  Comitato Elettrotecnico Italiano

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Light-emitting diodes (excluding
      devices for fibre optic
      systems or subsystems)
    4 Infrared-emitting diodes
      (excluding devices for fibre
      optic systems or subsystems)
    5 Photodiodes (excluding
      devices for fibre optic
      systems or subsystems)
    6 Phototransistors (excluding
      devices for fibre optic
      systems or subsystems)
    7 Photocouplers, optocouplers
      (with output transistor)
    8 Photocouplers (optocouplers)
      providing protection against
      electrical shock
    9 Laser diodes
    Annex A (informative) - Cross
            references table
    Annex B (normative) - Input/output
            safety test

    Abstract - (Show below) - (Hide below)

    Defines the essential ratings and characteristics of the following categories or subcategories of optoelectronic devices which are not intended to be used in the field of fibre optic systems or subsystems.

    General Product Information - (Show below) - (Hide below)

    Committee CT 309
    Development Note Classificazione CEI 47-1012. (08/2015)
    Document Type Standard
    Publisher Comitato Elettrotecnico Italiano
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60112:2003+AMD1:2009 CSV Method for the determination of the proof and the comparative tracking indices of solid insulating materials
    HD 214 : 200S2 RECOMMENDED METHOD FOR DETERMINING THE COMPARATIVE TRACKING INDEX OF SOLID INSULATING MATERIALS UNDER MOIST CONDITIONS
    IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    EN 60065:2014/AC:2017-01 AUDIO, VIDEO AND SIMILAR ELECTRONIC APPARATUS - SAFETY REQUIREMENTS (IEC 60065:2014/COR2:2016)
    EN 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    HD 625.1 : 200S1 INSULATION COORDINATION FOR EQUIPMENT WITHIN LOW-VOLTAGE SYSTEMS - PRINCIPLES, REQUIREMENTS AND TESTS
    EN 60747-5-3:2001/A1:2002 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-3: OPTOELECTRONIC DEVICES - MEASURING METHODS
    IEC 60216-2:2005 Electrical insulating materials - Thermal endurance properties - Part 2: Determination of thermal endurance properties of electrical insulating materials - Choice of test criteria
    EN 60747-5-1:2001/A2:2002 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-1: OPTOELECTRONIC DEVICES - GENERAL
    HD 611.1 : 200S1 GUIDE FOR THE DETERMINATION OF THERMAL ENDURANCE PROPERTIES OF ELECTRICAL INSULATING MATERIALS - GENERAL GUIDELINES FOR AGEING PROCEDURES AND EVALUATION OF TEST RESULTS
    IEC 60747-5-3:1997+AMD1:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
    IEC 60306-1:1969 Measurement of photosensitive devices - Part 1: Basic recommendations
    EN 60068-2-27:2009 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    HD 323.2.3 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE
    IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
    EN 60068-2-17:1994 Environmental testing - Part 2: Tests - Test Q: Sealing
    IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
    IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
    IEC 60672-2:1999 Ceramic and glass insulating materials - Part 2: Methods of test
    EN 60068-2-6:2008 Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal)
    IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
    IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    EN 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
    HD 323.2.2 : 200S1 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST B: DRY HEAT
    HD 426.2 : 200S1 SPECIFICATION FOR CERAMIC AND GLASS INSULATING MATERIALS - METHODS OF TEST
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    HD 611.2 : 200S1 GUIDE FOR THE DETERMINATION OF THERMAL ENDURANCE PROPERTIES OF ELECTRICAL INSULATING MATERIALS - CHOICE OF TEST CRITERIA
    IEC 60664-1:2007 Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests
    EN 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    IEC 60216-1:2013 Electrical insulating materials - Thermal endurance properties - Part 1: Ageing procedures and evaluation of test results
    EN 60695-2-2:1994/A1:1995 FIRE HAZARD TESTING - TEST METHODS - NEEDLE-FLAME TEST
    IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
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