• CEI EN 61280-2-2 : 2013

    Current The latest, up-to-date edition.

    FIBRE OPTIC COMMUNICATION SUBSYSTEM TEST PROCEDURES - PART 2-2: DIGITAL SYSTEMS - OPTICAL EYE PATTERN, WAVEFORM AND EXTINCTION RATIO MEASUREMENT

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-2013

    Publisher:  Comitato Elettrotecnico Italiano

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Apparatus
    5 Signal under test
    6 Instrument set-up and device under test set-up
    7 Measurement procedures
    8 Eye-diagram analysis using a mask
    9 Test result
    Bibliography
    Annex ZA (normative) - Normative references to
             international publications with their
             corresponding European publications

    Abstract - (Show below) - (Hide below)

    Defines a test procedure to verify compliance with a predetermined waveform mask and to measure the eye pattern and waveform parameters such as rise time, fall time, modulation amplitude and extinction ratio.

    General Product Information - (Show below) - (Hide below)

    Committee CT 86
    Development Note Classificazione CEI 86-96. (08/2001)
    Document Type Standard
    Publisher Comitato Elettrotecnico Italiano
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    IEEE 802.3-2012 IEEE Standard for Ethernet
    EN 61280-2-3:2009/corrigendum:2010 FIBRE OPTIC COMMUNICATION SUBSYSTEM TEST PROCEDURES - PART 2-3: DIGITAL SYSTEMS - JITTER AND WANDER MEASUREMENTS
    IEC 60825-1:2014 Safety of laser products - Part 1: Equipment classification and requirements
    IEC 61280-2-3:2009 Fibre optic communication subsystem tets procedures - Part 2-3: Digital systems - Jitter and wander measurements
    IEC 61281-1:1999 Fibre optic communication subsystems - Part 1:Generic specification
    TIA 559 : 1989(R2002) SINGLE-MODE FIBER OPTIC SYSTEM TRANSMISSION DESIGN
    TIA 526-4 : A1997 OPTICAL EYE PATTERN MEASUREMENT PROCEDURE
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