MIL-R-39008 Revision C:1990
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RESISTOR, FIXED, COMPOSITION (INSULATED), ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
BS EN 62258-1:2010
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Semiconductor die products Procurement and use |
MIL C 39003 : H
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CAPACITOR, FIXED, ELECTROLYTIC (SOLID ELECTROLYTE) TANTALUM, ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR |
MIL C 55681 : D SUPP 1
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CAPACITOR, CHIP, MULTIPLE LAYER, FIXED UNENCAPSULATED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
I.S. EN 62258-1:2010
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SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE |
EN 62258-1:2010
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Semiconductor die products - Part 1: Procurement and use |
01/206130 DC : DRAFT AUG 2001
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IEC 62258 - SEMICONDUCTOR DIE PRODUCTS - MINIMUM REQUIREMENTS FOR PROCUREMENT AND USE - PART 1: GENERAL REQUIREMENTS - MECHANICAL, MATERIAL AND CONNECTIVITY |
ISO 14560:2004
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Acceptance sampling procedures by attributes Specified quality levels in nonconforming items per million |
ISO 28597:2017
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Acceptance sampling procedures by attributes — Specified quality levels in nonconforming items per million |
MIL R 55342 : C
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RESISTORS, FIXED, FILM, CHIP, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
MIL C 23269 : E
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CAPACITORS, FIXED, GLASS DIELECTRIC, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
MIL R 39005 : D
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RESISTOR, FIXED, WIREWOUND, (ACCURATE), ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
MIL C 39014 : E
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CAPACITOR, FIXED, CERAMIC DIELECTRIC (GENERAL PURPOSE) ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
MIL C 39006 : E
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CAPACITORS, FIXED, ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
PD ES 59008-2:1999
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Data requirements for semiconductor die Vocabulary |
MIL R 39015 : C (3)
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RESISTOR, VARIABLE, WIRE WOUND (LEAD SCREW ACTUATED), ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR |
MIL C 83421 : B
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CAPACITOR, FIXED, SUPERMETALLIZED PLASTIC FILM DIELECTRIC, (DC, AC, OR DC AND AC) HERMETICALLY SEALED IN METAL CASES, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
MIL R 39007 : G (3) SUPP 1A
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RESISTORS, FIXED, WIRE-WOUND (POWER TYPE), NONESTABLISHED RELIABILITY, ESTABLISHED RELIABILITY, AND SPACE LEVEL, GENERAL SPECIFICATION FOR |
BS ISO 28597:2017
|
Acceptance sampling procedures by attributes. Specified quality levels in nonconforming items per million |
MIL C 55514 : C
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CAPACITOR, FIXED, PLASTIC (OR METALLIZED PLASTIC) DIELECTRIC, DC OR DC AC, IN NONMETAL CASES, ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR |
MIL C 49467 : (2) SUPP 1
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CAPACITORS, FIXED, CERAMIC, MULTILAYER, HIGH VOLTAGE (GENERAL PURPOSE) ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
MIL-R-874 Base Document:1990
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RESISTOR NETWORKS, FIXED, FILM, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
MIL C 49464 : A
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CAPACITORS, CHIP, SINGLE LAYER, FIXED, PARALLEL PLATE, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY |
MIL R 914 : 0
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RESISTOR NETWORKS, FIXED, FILM, SURFACE MOUNT, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
MIL R 39009 : C (3) SUPP 1
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RESISTOR, FIXED, WIREWOUND (POWER TYPE, CHASSIS MOUNTED) ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR |
BS ISO 14560:2004
|
Acceptance sampling procedures by attributes. Specified quality levels in nonconforming items per million |
MIL C 39001 : B
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CAPACITOR, FIXED, MICA DIELECTRIC, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR.. |
MIL R 55182 : F
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RESISTORS, FIXED, FILM, ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR |
MIL S 19500 : J
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SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
MIL C 55365 : C (5)
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CAPACITOR, CHIP, FIXED, TANTALUM, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
MIL R 39017 : E (5) SUPP 1
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RESISTOR, FIXED, FILM (INSULATED) ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
IEC 62258-1:2009
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Semiconductor die products - Part 1: Procurement and use |
CEI EN 62258-1 : 2011
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SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE |