EN 60679-1 : 2017

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PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION (IEC 60679-1:2017)

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Published date: 12-01-2013

Publisher: European Committee for Standards - Electrical

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Table of Contents - (Show below) - (Hide below)

FOREWORD
1 Scope
2 Normative references
3 Terms, definitions and general information
4 Quality assessment procedures
Annex A (normative) - Load circuit for logic drive
Annex B (normative) - Latch-up test
Annex C (normative) - Electrostatic discharge
        sensitivity classification
Annex D (normative) - Digital interfaced crystal
        Oscillator's function
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Abstract - (Show below) - (Hide below)

Defines general requirements for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as 'Oscillator'), of assessed quality using either capability approval or qualification approval procedures.

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Published
Document Type	Standard
Status	Current
Publisher	European Committee for Standards - Electrical
Development Note	Supersedes EN 169000 (05/2001)
Pages
ISBN
Committee	SR 49
Supersedes	EN 60679-1:2007

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Equivalent Standard(s)	Relationship
DS EN 60679-1 : 2007	Identical
NBN EN 60679-1 : 2007	Identical
I.S. EN 60679-1:2007	Identical
CEI EN 60679-1 : 3ED 2018	Identical
IEC 60679-1 : 2017	Identical
BS EN 60679-1 : 2007	Identical
SN EN 60679-1 : 1998 AMD 2 2003	Identical
CEI EN 60679-1 : 2009	Identical
DIN EN 60679-1 : 2013	Identical
NF EN 60679-1 : 2013	Identical
UNE-EN 60679-1:2017	Identical
UNE-EN 60679-1:2017	Identical
CEI EN 60679-1 : 3ED 2018	Identical

Standards Referencing This Book - (Show below) - (Hide below)

IEC 62884-1 : 1ED 2017	MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT
EN 60469 : 2013	TRANSITIONS, PULSES AND RELATED WAVEFORMS - TERMS, DEFINITIONS AND ALGORITHMS (IEC 60469:2013)
EN ISO 80000-1 : 2013	QUANTITIES AND UNITS - PART 1: GENERAL (ISO 80000-1:2009 + COR 1:2011)
ATIS 0900101 : 2013	SYNCHRONIZATION INTERFACE STANDARD
IEC 60068-2-27 : 4.0:2008	ENVIRONMENTAL TESTING - PART 2-27: TESTS - TEST EA AND GUIDANCE: SHOCK
EN 61340-5-1 : 2016 COR 2017	ELECTROSTATICS - PART 5-1: PROTECTION OF ELECTRONIC DEVICES FROM ELECTROSTATIC PHENOMENA - GENERAL REQUIREMENTS (IEC 61340-5-1:2016/COR1:2017)
EN 62884-1 : 2017	MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT (IEC 62884-1:2017)
ITU G.813 : 2003 COR 2 2016	TIMING CHARACTERISTICS OF SDH EQUIPMENT SLAVE CLOCKS (SEC)
IEC 61837-1 : 2.0	SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 1: PLASTIC MOULDED ENCLOSURE OUTLINES
IEC 61340-5-1 : 2.0	ELECTROSTATICS - PART 5-1: PROTECTION OF ELECTRONIC DEVICES FROM ELECTROSTATIC PHENOMENA - GENERAL REQUIREMENTS
IEC 60679-4 : 1.0	QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - SECTIONAL SPECIFICATION - CAPABILITY APPROVAL
IEC 60469 : 1ED 2013	TRANSITIONS, PULSES AND RELATED WAVEFORMS - TERMS, DEFINITIONS AND ALGORITHMS
IEC TR 61000-4-1 : 1ED 2016	ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-1: TESTING AND MEASUREMENT TECHNIQUES - OVERVIEW OF THE IEC 61000-4 SERIES
IEC 61837-2:2011+AMD1:2014 CSV	SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES
IEC 60679-5 : 1.0	QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - SECTIONAL SPECIFICATION - QUALIFICATION APPROVAL
IEC 61837-4 : 2.0	SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 4: HYBRID ENCLOSURE OUTLINES
IEC 60749-27 : 2.1	SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)
IEC 61019-1 : 1.0	SURFACE ACOUSTIC WAVE (SAW) RESONATORS - PART 1: GENERIC SPECIFICATION
ITU G.810 : 96 CORR 1 2001	DEFINITIONS AND TERMINOLOGY FOR SYNCHRONIZATION NETWORKS
IEC 60068-2-64 : 2.0	ENVIRONMENTAL TESTING - PART 2-64: TESTS - TEST FH: VIBRATION, BROADBAND RANDOM AND GUIDANCE
ATIS 0900105.03 : 2013	SYNCHRONOUS OPTICAL NETWORK - (SONET) - JITTER NETWORK INTERFACES
GR 253 CORE : ISSUE 5	SYNCHRONOUS OPTICAL NETWORK (SONET) TRANSPORT SYSTEMS: COMMON GENERIC CRITERIA
IEC 61837-3 : 2.0	SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURES
EN 60749-27 : 2006 AMD 1 2012	SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM) (IEC 60749-27:2006/A1:2012)
IEC 61019-2 : 2.0	SURFACE ACOUSTIC WAVE (SAW) RESONATORS - PART 2: GUIDE TO THE USE
IEC 60749-26 : 3.0	SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 26: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - HUMAN BODY MODEL (HBM)
IEC 60068-2-17 : 4.0	ENVIRONMENTAL TESTING - TEST Q: SEALING
ISO 80000-1 : 2009	QUANTITIES AND UNITS - PART 1: GENERAL
IEC 60050-561 : 2.0	INTERNATIONAL ELECTROTECHNICAL VOCABULARY - PART 561: PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC DEVICES AND ASSOCIATED MATERIALS FOR FREQUENCY CONTROL, SELECTION AND DETECTION
IEC 60122-1 : 3.0	QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
EN 60749-26 : 2014	SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 26: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - HUMAN BODY MODEL (HBM) (IEC 60749-26:2013)
IEC 60748-2 : 2.0	SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - DIGITAL INTEGRATED CIRCUITS
IEC 60679-3 : 3.0	QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES AND LEAD CONNECTIONS
IEC 60679-2 : 1.0	QUARTZ CRYSTAL CONTROLLED OSCILLATORS - PART 2: GUIDE TO THE USE OF QUARTZ CRYSTAL CONTROLLED OSCILLATORS
IEC 60068-2-6 : 0	ENVIRONMENTAL TESTING - PART 2-6: TESTS - TEST FC: VIBRATION (SINUSOIDAL)
ITU G.825 : 2000 AMD 1 2008	THE CONTROL OF JITTER AND WANDER WITHIN DIGITAL NETWORKS WHICH ARE BASED ON THE SYNCHRONOUS DIGITAL HIERARCHY (SDH)
MIL PRF 55310 : E	OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR

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EN 60679-1 : 2017

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