EN 61007:1997

FOREWORD
1 Scope
2 Normative references
3 Terminology
4 Test procedures
  4.1 Test and measurement conditions
      4.1.1 Measurement uncertainty
      4.1.2 Alternative test methods
  4.2 Visual inspection
      4.2.1 Protective screen position
      4.2.2 Quality of solder joints
  4.3 Dimensioning and gauging procedure
  4.4 Electrical test procedures
      4.4.1 Winding resistance
      4.4.2 Insulation tests
      4.4.3 Losses
      4.4.4 Inductance
      4.4.5 Unbalance
      4.4.6 Capacitance
      4.4.7 Transformation ratios
      4.4.8 Resonant frequency
      4.4.9 Signal transfer characteristics
      4.4.10 Frequency response
      4.4.11 Pulse characteristics
      4.4.12 Voltage-time product rating
      4.4.13 Total harmonic distortion
      4.4.14 Voltage regulation
      4.4.15 Temperature rise
      4.4.16 Surface temperature
      4.4.17 Phase test (polarity)
      4.4.18 Screens
      4.4.19 Noise
      4.4.20 Corona test
      4.4.21 Magnetic fields
      4.4.22 Inrush current
  4.5 Environmental test procedures
      4.5.1 General
      4.5.2 Soldering
      4.5.3 Robustness of terminations and integral mounting devices
      4.5.4 Shock
      4.5.5 Bump
      4.5.6 Vibration (sinusoidal)
      4.5.7 Acceleration, steady state
      4.5.8 Rapid change of temperature (thermal shock in air)
      4.5.9 Sealing
      4.5.10 Climatic sequence
      4.5.11 Damp heat, steady state
      4.5.12 Dry heat
      4.5.13 Mould grown
      4.5.14 Salt mist, cyclic (sodium chloride solution)
      4.5.15 Sulphur dioxide test for contacts and connections
      4.5.16 Fire hazard
      4.5.17 Immersion in cleaning solvents
  4.6 Endurance test procedures
      4.6.1 Short-term endurance (load run)
      4.6.2 Long-term endurance (life test)
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         publications

Describes measuring methods and test procedures for inductors and transformers for use in electronic and telecommunication equipment that may be involved in any specifications for such components, in particular those forming part of the IEC Quality Assessment System for Electronic Components (IECQ).