EN 60444-4:1997
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Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz |
IEC 60068-1:2013
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Environmental testing - Part 1: General and guidance |
IEC 60068-2-58:2015+AMD1:2017 CSV
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Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD) |
IEC 60068-2-27:2008
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Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
IEC 60068-2-20:2008
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Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
IEC 60122-3:2010
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Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
IECQ 001002-3:2005
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IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES |
IEC 60068-2-21:2006
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Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
IEC 60068-2-13:1983
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Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure |
EN 60444-2:1997
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Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units |
IEC 60444-5:1995
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Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
IEC 60444-2:1980
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Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units |
IEC 61178-3:1993
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Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval |
EN 61760-1:2006
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SURFACE MOUNTING TECHNOLOGY - PART 1: STANDARD METHOD FOR THE SPECIFICATION OF SURFACE MOUNTING COMPONENTS (SMDS) |
IEC 61760-1:2006
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Surface mounting technology - Part 1: Standard method for the specification of surface mounting components (SMDs) |
IECQ 001002-2:1998
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IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 2: DOCUMENTATION |
IEC 60444-6:2013
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Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) |
EN 60068-2-7:1993
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Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state |
IEC 60068-2-64:2008
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Environmental testing - Part 2-64: Tests - Test Fh: Vibration, broadband random and guidance |
EN 60444-1:1997/A1:1999
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MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK - PART 1: BASIC METHOD FOR THE MEASUREMENT OF RESONANCE FREQUENCY AND RESONANCE RESISTANCE OF QUARTZ CRYSTAL UNITS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK |
IEC TR 60444-4:1988
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Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz |
IEC 60410:1973
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Sampling plans and procedures for inspection by attributes |
IEC 60068-2-3:1969
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Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
IEC GUIDE 102:1996
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Electronic components - Specification structures for qualityassessment (Qualification approval and capability approval) |
EN 60068-2-17:1994
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Environmental testing - Part 2: Tests - Test Q: Sealing |
IEC 60068-2-17:1994
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Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
IEC 60068-2-2:2007
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Environmental testing - Part 2-2: Tests - Test B: Dry heat |
IECQ 001002-1:1998
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IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 1: ADMINISTRATION |
EN 60068-2-13:1999
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Environmental testing - Part 2: Tests - Test M: Low air pressure |
IEC 60050-561:2014
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International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection |
IEC 60068-2-29:1987
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Environmental testing. Part 2: Tests. Test Eb and guidance: Bump |
IEC 61178-2:1993
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Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval |
EN 60444-5:1997
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Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
IEC 60068-2-1:2007
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Environmental testing - Part 2-1: Tests - Test A: Cold |
IEC 60068-2-14:2009
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Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
EN 60068-2-45:1992/A1:1993
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Environmental testing - Part 2: Tests - Test Xa and guidance: Immersion in cleaning solvents |
IEC 60068-2-30:2005
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Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |